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Surface Analysis of Silicones

  • Stuart Leadley
  • Lesley-Ann O’Hare
  • Christopher McMillanEmail author
Part of the Advances in Silicon Science book series (ADSS, volume 4)

Abstract

As many of the desirable performance differences of silicones are related to their surface properties, it is important to be able analyze their surfaces effectively. This chapter presents an overview of key surface analysis techniques that can provide information on the surface morphology, chemical composition and surface physical properties of silicone materials. These techniques are X-ray photoelectron spectroscopy, secondary ion mass spectrometry, scanning electron microscopy and scanning probe microscopy. Both fundamentals and applications to the analysis of silicones are covered. It is evident from a consideration of key examples that in many cases it is a combination of these analytical techniques that provides a clearer picture of the surface properties of silicones.

Keywords

Analysis of silicone surface morphology and chemical composition X-ray photoelectron spectroscopy Secondary ion mass spectrometry Scanning electron microscopy Scanning probe microscopy Surface structure—properties relationships 

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Copyright information

© Springer Science+Business Media Dordrecht 2012

Authors and Affiliations

  • Stuart Leadley
    • 1
  • Lesley-Ann O’Hare
    • 2
  • Christopher McMillan
    • 2
    Email author
  1. 1.Dow Corning EuropeSeneffeBelgium
  2. 2.Dow Corning CorporationMidlandUSA

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