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A Low Noise 32-Channel CMOS Read-Out Circuit for X-ray Silicon Drift Chamber Detectors

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Sensors and Microsystems

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 91))

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Abstract

In this paper we present a 32-channel integrated front-end circuit for low-energy (0.5–100 keV) X-ray detection with a multi-anode silicon drift detector. The front-end circuit includes 32 read-out pixel cells (RPC), each consisting of a low noise preamplifier, a second-order RC-CR pulse shaper, a peak stretcher, an amplitude and a peak discriminator, as well as a reset and pile-up rejection circuit. Most of the parameters of the front-end circuit are programmable through a digital configuration register, supporting daisy-chain connection. At room temperature the equivalent noise charge of the RPC is 18.3 e? and its linearity error is lower than 5% over the complete input range. The front-end circuit has been designed in a 0.35-?m CMOS technology with main 3.3-V power supply. A single RPC occupies an area of 200 × 380 ?m2 and consumes 0.4 mW.

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References

  1. Labanti C et al (1999) ICARUS ASIC: a 16 channel photodiode read-out system. IEEE Trans Nucl Sci 46(3):144–149

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  2. Debertin K, Helmer RG (1988) Gamma and X-ray spectrometry with semiconductor detectors. North-Holland, Amsterdam

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  3. Caccia S et al (2008) A mixed-signal spectroscopic-grade and highfunctionality CMOS readout cell for semiconductor X-gamma ray pixel detectors. IEEE Trans Nucl Sci 55(5):2721–2726

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  4. Bastia P et al (2006) An integrated reset/pulse pile-up rejection circuit for pixel readout ASICs. IEEE Trans Nucl Sci 53(1):414–417

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Correspondence to M. Grassi .

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© 2011 Springer Science+Business Media B.V.

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Picolli, L., Grassi, M., Ferri, M., Malcovati, P. (2011). A Low Noise 32-Channel CMOS Read-Out Circuit for X-ray Silicon Drift Chamber Detectors. In: Neri, G., Donato, N., d'Amico, A., Di Natale, C. (eds) Sensors and Microsystems. Lecture Notes in Electrical Engineering, vol 91. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-1324-6_40

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  • DOI: https://doi.org/10.1007/978-94-007-1324-6_40

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  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-007-1323-9

  • Online ISBN: 978-94-007-1324-6

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