Abstract
In general microscopy is devoted to link microstructural observations to physical properties. Although the microstructure-property relationship is in itself a truism, the actual linkage between structural aspects of defects in a material studied by microscopy on one hand and its physical property on the other is in most cases almost elusive. The reason is that various physical properties are actually determined by the collective behavior of defects. Even the behavior of one singular defect is often irrelevant. There are at least two reasons that prevent a straightforward correlation between microscopic structural information to the physical properties of materials: one fundamental and one practical reason. First, in the field of dislocations and interfaces we are faced with highly non-linear and non-equilibrium effects. This is a fundamental problem because there doesn’t exist an appropriate analysis of these effects. Secondly, one should realize that a quantitative electron microscopy evaluation of the structure-property relationship is also hampered by a practical reason, namely the limited statistics. In particular, in situations where there is only a small volume fraction of defects present or a very inhomogeneous distribution statistical sampling may be a problem. Nevertheless, the situation is not hopeless and nowadays in-situ dynamic studies are possible to link microscopy information to functional and structural properties. In addition electron microscopy can be employed not only to observe but also as an instrument to measure functional properties
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De Hosson, J., Chechenin, N.G., Vystavel, T. (2003). Nano-Structured Magnetic Films Investigated with Lorentz Transmission Electron Microscopy and Electron Holography. In: Tsakalakos, T., Ovid’ko, I.A., Vasudevan, A.K. (eds) Nanostructures: Synthesis, Functional Properties and Applications. NATO Science Series, vol 128. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-1019-1_27
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DOI: https://doi.org/10.1007/978-94-007-1019-1_27
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