Abstract
Very different kinds of magnetic flux penetration patterns have been reported in the type-II superconductor Nb. Using our advanced magneto-optical setup we investigate the flux penetration in Nb thin films. We find that depending on the sapphire substrate orientation (either A-plane or R-plane) qualitatively different structures are observed. In particular, for the A-plane orientation we find fingering and branching, whereas for R-plane samples a rough but continuous flux front is observed. Since Nb easily accepts hydrogen atoms as interstitial impurities, the influence of static pinning centers on the flux penetration process can be investigated. We find that the flux penetration drastically changes, becoming more irregular. The possibility to add a well- controlled amount of disorder makes NbHx an ideal system to study the influence of quenched noise on roughening phenomena.
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Welling, M.S., Aegerter, C.M., Wijngaarden, R.J., Griessen, R. (2004). Effect of Substrate Orientation and Hydrogen Impurities on Flux Penetration in Nb Thin Films. In: Johansen, T.H., Shantsev, D.V. (eds) Magneto-Optical Imaging. NATO Science Series, vol 142. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-1007-8_27
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DOI: https://doi.org/10.1007/978-94-007-1007-8_27
Publisher Name: Springer, Dordrecht
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