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Reliability issues of NAND Flash memories

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Inside NAND Flash Memories

Abstract

The continuous demand for NAND flash memories with higher performance and storage capabilities pushes the manufactures towards the limits of present technologies and to explore new solutions, both from the physical and the architectural point of view.

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Authors and Affiliations

  1. Dip. Ing., Università degli Studi di Ferrara, Ferrara, Italy

    C. Zambelli, A. Chimenton & P. Olivo

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  1. C. Zambelli
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  2. A. Chimenton
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  3. P. Olivo
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Correspondence to C. Zambelli .

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Zambelli, C., Chimenton, A., Olivo, P. (2010). Reliability issues of NAND Flash memories. In: Inside NAND Flash Memories. Springer, Dordrecht. https://doi.org/10.1007/978-90-481-9431-5_4

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  • DOI: https://doi.org/10.1007/978-90-481-9431-5_4

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  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-90-481-9430-8

  • Online ISBN: 978-90-481-9431-5

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