Abstract
NAND business requires huge investments in technology developments and manufacturing. Moreover, leading edge NAND Flash memory costs and yield issues increase with every new technology node. Addressing test issues is mandatory for NAND Flash manufacturers to accelerate yield learning and enhancement, maintaining a competitive cost structure.
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Silvagni, A. (2010). NAND design for testability and testing. In: Inside NAND Flash Memories. Springer, Dordrecht. https://doi.org/10.1007/978-90-481-9431-5_15
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DOI: https://doi.org/10.1007/978-90-481-9431-5_15
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