Abstract
Amorphous x-ray diffraction is used to obtain structural information on amorphous solids and liquids at high pressure as well as other materials without long range crystalline order including biologically important macromolecules and nanomaterials. The intense x-ray beams provided by synchrotron sources are ideal for diffraction studies of noncrystalline materials. We illustrate this with studies of the transition between low- and high-density forms of amorphous Si in the diamond anvil cell at high pressure, and the compressibility of amyloid fibrils.
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Acknowledgments
PFM acknowledges support from EPSRC SRF EP/D07357X and Portfolio EP/D504782 (joint with C.R.A. Catlow and P. Barnes). FM is a postdoctoral research fellow of the Research Foundation Flanders (FWO-Vlaanderen). DD is now supported by the Institute of Shock Physics. The work presented here is based on the Ph.D. theses of DD and RQC (Daisenberger, 2009; Quesada Cabrera, 2009). We thank V. Dmitriev (SNBL) and M. Mezouar ID27 at ESRF (Grenoble) for assistance with experiments.
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Mcmillan, P.F., Daisenberger, D., Cabrera, R.Q., Meersman, F. (2010). Amorphous X-Ray Diffraction at High Pressure: Polyamorphic Silicon and Amyloid Fibrils. In: Boldyreva, E., Dera, P. (eds) High-Pressure Crystallography. NATO Science for Peace and Security Series B: Physics and Biophysics. Springer, Dordrecht. https://doi.org/10.1007/978-90-481-9258-8_38
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DOI: https://doi.org/10.1007/978-90-481-9258-8_38
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