Abstract
Most high-speed communications standards specify the jitter performance to ensure the quality of the communication links. As jitter is the major contributor to BER, communications link performance can be verified relatively quickly by measuring jitter.
Jitter can be measured with a variety of methods [1, 4–7, 15, 16]. Some instruments and methods are more accurate if the jitter is Gaussian, which is often not the case (e.g., if PJ is present), and each testing method has its own pros and cons as discussed in Chapter 1.
In this chapter, we propose a rapid RJ measurement technique that builds on the Probability Digitizer technique [11, 12] and unpublished algorithms developed by Dr. Leonard Monk and Francine Hallé, and incorporated in Teradyne’s Serial Port Qualifier (SPQ) and Source Synchronous Pin Electronics (SSPE) instruments. It is a variant of Time-Domain Data Acquisition [4], with two important modifications. First, it uses a fast sampling frequency that can even exceed the data rate to minimize test time and reject low-frequency PJ. Second, the fact that only individual, as opposed to cumulative, edge measurements are made permits the use of short pattern sub-sequences and filters out DDJ and low-frequency PJ. When measuring RJ, we do not want PJ to affect the result, especially PJ of such a low frequency that it will be ignored by receiving devices.
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Hong, D., Cheng, KT. (2010). An Efficient Jitter Measurement Technique. In: Efficient Test Methodologies for High-Speed Serial Links. Lecture Notes in Electrical Engineering, vol 51. Springer, Dordrecht. https://doi.org/10.1007/978-90-481-3443-4_2
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DOI: https://doi.org/10.1007/978-90-481-3443-4_2
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