Abstract
In this paper an overview of state of the art techniques to measure and correct non-idealities in a pipelined ADC is given. The paper discusses the motivations for digital calibration, and subsequently details state of the art calibration approaches. System tradeoffs of commonly used calibration techniques are analyzed. A discussion of how digital calibration can be used to enable the next generation of very low power ‘smart-ADCs’ is also given.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
K. Bult, G.J.G.M. Geelen, “A fast settling CMOS op amp for SC circuits with 90-dB DB Gain”, IEEE Journal of Solid-State Circuits, vol.25, pp.1379–1384, Dec. 1990.
F. You, S.H.K. Embabi, E. Sanchez-Sinencio, “Multistage amplifier topologies with nested Gm-C compensation,” IEEE Journal of Solid-State Circuits, vol.32, no.12, pp.2000–2011, Dec. 1997.
S.-H. Lee, B.-S. Song, “Simplified digital calibration for multi-stage analog-to-digital converters,” 1993 IEEE International Symposium on Circuits and Systems, 1993, ISCAS ‘93, vol.2, 3–6, pp.1216–1219, May 1993.
D.Y. Chang, J. Li, U.K. Moon, “Radix-based digitial calibration techniques for multi-stage recycling pipelined ADCs”, IEEE Transactions on Circuits and Systems I, vol.51, pp.2133–2140, Nov. 2004.
C.R. Grace, P.J. Hurst, S.H. Lewis, “A 12b 80 MS/s pipelined ADC with bootstrapped digital calibration”, in IEEE International Solid-State Circuits Conference. (ISSCC) Digital Technical Papers, pp.460–539, Feb. 2004.
U.K. Moon, B.-S. Song, “Background digital calibration techniques for pipelined ADC’s”, IEEE Transactions on Circuits and Systems II, vol.44, pp.102–109, Feb. 1997.
S.-U. Kwak, B.-S. Song, K. Bacrania, “A 15-b, 5-Msample/s low-spurious CMOS ADC,” IEEE Journal of Solid-State Circuits, vol.32, no.12, pp.1866–1875, Dec. 1997.
O.E. Erdogan, P.J. Hurst, S.H. Lewis, “A 12-b digital-background-calibrated algorithmic ADC with -90-dB THD,” IEEE Journal of Solid-State Circuits, vol.34, no.12, pp.1812–1820, Dec. 1999.
I. Galton, “Digital cancellation of D/A converter noise in pipelined A/D converters,” IEEE TCAS-II. vol.47, pp.185–196, Mar. 2000.
J. Li, U.K. Moon, “Background calibration techniques for multistage pipelined ADCs with digital redundancy,” IEEE Transactions on Circuits and Systems II, vol.50, pp.531–538, Sep. 2003.
Y. Chiu, C.W. Tsang, B. Nikolic, P.R. Gray, “Least mean square adaptive digital background calibration of pipelined analog-to-digital converters”, IEEE TCAS-I, vol.51, pp.38–46, Jan. 2004.
X. Wang, P.J. Hurst, S.H. Lewis, “A 12-bit 20-Msample/s pipelined analog-to-digital converter with nested digital background calibration,” IEEE Journal of Solid-State Circuits, vol.39, no.11, pp.1799–1808, Nov. 2004.
E. Siragusa, I. Galton, “A digitally enhanced 1.8-V 15-bit 40-MSample/s CMOS pipelined ADC,” IEEE Journal of Solid-State Circuits, vol.39, no.12, pp. 2126–2138, Dec. 2004.
J. Li, G.-C. Ahn, D.-Y. Chang, U.-K. Moon, “A 0.9-V 12-mW 5-MSPS algorithmic ADC with 77-dB SFDR,” IEEE Journal of Solid-State Circuits, vol.40, no.4, pp.960–969, Apr. 2005.
H.-C. Liu, Z.-M. Lee, J.-T. Wu, “A 15-b 40-MS/s CMOS pipelined analog-to-digital converter with digital background calibration,” IEEE Journal of Solid-State Circuits, vol.40, no.5, pp.1047–1056, May 2005.
S. Ray, B.-S. Song, “A 13-b linear, 40-MS/s pipelined ADC with self-configured capacitor matching”, IEEE JSSC, vol.42, pp.463–474, Mar. 2007.
E. Siragusa, I. Galton, “A digitally enhanced 1.8-V 15-bit 40-MSample/s CMOS pipelined ADC,” IEEE Journal of Solid-State Circuits, vol.39, no.12, pp.2126–2138, Dec. 2004.
J. McNeill, M. Coln, B. Larivee, “A split-ADC architecture for deterministic digital background calibration of a 16b 1 MS/s ADC,” Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International, vol.48, 6–10, pp.276–598, Feb. 2005.
Y. Chiu, C.W. Tsang, B. Nikolic, P.R. Gray, “Least mean square adaptive digital background calibration of pipelined analog-to-digital converters,” IEEE TCAS-I, vol.51, pp.38–46, Jan. 2004.
I. Ahmed, D.A. Johns, “An 11-Bit 45 MS/s pipelined ADC with rapid calibration of DAC errors in a multibit pipeline stage,” IEEE Journal of Solid-State Circuits, vol.43, no.7, pp.1626–1637, Jul. 2008.
B. Murmann et al., “A 12-bit 75-MS/s pipelined ADC using open-loop residue amplification,” IEEE Journal of Solid-State Circuits, vol.38, pp.2040–2050, Dec. 2003.
J.A. McNeill, S. Goluguri, A. Nair, “Split-ADC” digital background correction of open-loop residue amplifier nonlinearity errors in a 14b pipeline ADC,” IEEE International Symposium on Circuits and Systems, 2007. ISCAS 2007, vol., no. 27–30, pp.1237–1240, May 2007.
I. Ahmed, J. Mulder, D.A. Johns, “A 50MS/s 9.9 mW pipelined ADC with 58dB SNDR in 0.18um CMOS using capacitive charge-pumps,” Solid-State Circuits Conference, 2009. Digest of Technical Papers. ISSCC. 2009 IEEE International, vol.52, 9–12, pp.164–165, Feb. 2009.
P. Quinn, M. Pribytko, “Capacitor matching insensitive 12-b 3.3 MS/s algorithmic ADC in 0.25/spl mu/m CMOS,” Custom Integrated Circuits Conference, 2003. Proceedings of the IEEE 2003, vol.21–24, pp.425–428, Sep. 2003.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2010 Springer Science+Business Media B.V.
About this chapter
Cite this chapter
Ahmed, I. (2010). Pipelined ADC Digital Calibration Techniques and Tradeoffs. In: Roermund, A., Casier, H., Steyaert, M. (eds) Analog Circuit Design. Springer, Dordrecht. https://doi.org/10.1007/978-90-481-3083-2_2
Download citation
DOI: https://doi.org/10.1007/978-90-481-3083-2_2
Published:
Publisher Name: Springer, Dordrecht
Print ISBN: 978-90-481-3082-5
Online ISBN: 978-90-481-3083-2
eBook Packages: EngineeringEngineering (R0)