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Nanoscale Investigation of Polycrystalline Ferroelectric Materials via Piezoresponse Force Microscopy

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Multifunctional Polycrystalline Ferroelectric Materials

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 140))

Abstract

Ferroelectrics possess a wide spectrum of functional properties including switchable polarization, piezoelectricity, pyroelectricity, dielectric nonlinearity, and high non-linear optical activity, which make these materials promising for a large number of applications [1]. These include nonvolatile random access memories (FERAM) [2], micro-electromechanical systems (MEMS) [3], infrared detectors, optical modulators and waveguides, and many others [4, 5]. The general trends of miniaturization in modern electronics demand a decrease in the size of the active ferroelectric elements to a submicron scale. This in turn necessitates the development of microscopic techniques allowing for the evaluation of ferroelectric and piezoelectric properties with nanoscale resolution. Several fundamental issues have to be addressed such as the effect of the films thickness and lateral size of the capacitor, or of the single grain on ferroelectric and piezoelectric properties, the relationship between grain/capacitor size and peculiarities of the polarization switching, and mechanisms of degradation effects, such as retention, imprint, and polarization fatigue [2].

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  1. Angewandte Physik, University of Duisburg-Essen, Duisburg, Germany

    V. V. Shvartsman

  2. Dept. of Ceramic and Glass Engineering, CICECO, University of Aveiro, Aveiro, Portugal

    A. L. Kholkin

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Shvartsman, V.V., Kholkin, A.L. (2011). Nanoscale Investigation of Polycrystalline Ferroelectric Materials via Piezoresponse Force Microscopy. In: Multifunctional Polycrystalline Ferroelectric Materials. Springer Series in Materials Science, vol 140. Springer, Dordrecht. https://doi.org/10.1007/978-90-481-2875-4_9

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