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Proceedings of International Conference on Computer Science and Information Technology pp 171–178Cite as

Statistical Tests for Combined Secret Key Sequence

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Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 255))

Abstract

The randomness and amount of secret key is important to the security of key management. A combined secret key method is presented and statistical tests are performed. Generate a set of combined secret keys according to the combined secret key generation algorithm using a smart card which performs compression mapping to compose a binary sequence of a given length for statistical test. The Frequency Test, Runs Test, and Serial Test are presented in detailed. The statistical conclusion is that the combined secret key sequence is accepted as random. Consequently, combined secret key is proved secure enough for secret key generation.

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References

  1. Zhang, Y.: The Random Number Generators and the Methods for Randomness Test. Univ. Electron. Sci. Technol. China. (2006)

    Google Scholar 

  2. Fips Pub 140-1.: Security Requirements for Cryptographic Modules. Federal Information Processing Standards Publication, Jan 1994

    Google Scholar 

  3. Li-Min, F., Deng-Guo, F., Chen, H.: On the parameter selection of randomness test. J. Commun. 30(1), 1–6 (2009)

    Google Scholar 

  4. Chen, X., Shu-Wang, L.: One way to read and random test of random sequence. Comput. Appl. 22(9), 7–9 (2002)

    Google Scholar 

  5. Rukhin, A., Soto, J., Nechvatal, J., Smid, M., Barker, E., Leigh, S., Levenson, M., Vangel, M., Banks, D., Heckert, A., Dray, J., Vo, S.: Special Publication 800-22 Revision 1a: A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications, April 2010

    Google Scholar 

  6. Hu, X., Zhao, G.: A CSK-based solution for person authentication. In: The Seventh Wuhan International Conference on E-business: Unlocking the Full Potential of Global Technology, pp. 244–249 (2008)

    Google Scholar 

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Acknowledgments

Authors would like to appreciate the support from the Program of Large-scale Network Authentication Center affiliated to Beijing Municipal Institute of Science & Technology Information (No. PXM2012_178214_000005) and the Innovation Group for Internet Real-name System (No. IG201003C2). And also thank the helpful suggestions from the director and colleagues in Beijing Key Laboratory of Network Cryptography Authentication.

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Authors and Affiliations

  1. Beijing Key Laboratory of Network Cryptography Authentication, Beijing Municipal Institute of Science and Technology Information, Beijing , China

    Guifen Zhao, Ying Li & Liping Du

Authors
  1. Guifen Zhao
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  2. Ying Li
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  3. Liping Du
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Corresponding author

Correspondence to Guifen Zhao .

Editor information

Editors and Affiliations

  1. Computer Science and Engineering, SOA University, Bhubaneswar, India

    Srikanta Patnaik

  2. Electronics and Computer Engineering Technology, Indiana State University, Terre Haute, IN, USA

    Xiaolong Li

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© 2014 Springer India

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Cite this paper

Zhao, G., Li, Y., Du, L. (2014). Statistical Tests for Combined Secret Key Sequence. In: Patnaik, S., Li, X. (eds) Proceedings of International Conference on Computer Science and Information Technology. Advances in Intelligent Systems and Computing, vol 255. Springer, New Delhi. https://doi.org/10.1007/978-81-322-1759-6_21

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  • DOI: https://doi.org/10.1007/978-81-322-1759-6_21

  • Publisher Name: Springer, New Delhi

  • Print ISBN: 978-81-322-1758-9

  • Online ISBN: 978-81-322-1759-6

  • eBook Packages: EngineeringEngineering (R0)

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