Abstract
The test cost and yield improvement are the major factors in the era of rapidly growing memory density and capacity. The Error-Correcting Codes (ECC) is widely used to detect and correct errors in memories. The Cyclic codes are one such code which belongs to the class of ECC with algebraic structure. This paper describes the algorithm and the memory architecture required to implement error detection and correction using cyclic code. It also presents a brief comparison between the single error correction technique based on cyclic code and another single error correction technique with code based on Reed–Muller matrix. These results are also compared with a multiple error correction technique based on modified matrix code. The results validate that cyclic codes have 80 % and 90 % lesser area, 90 and 50 % more correction efficiency when compared to the code based on Reed–Muller matrix and modified matrix codes, respectively, and around 45 % less delay when compared to the two codes.
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References
Shivkumar P, Kristler M, Keckler SW, Burger D, Alvisi L (2002) Modeling the effect of technology trends on the soft error rate of combinational logic. In: Proceedings of the international conference on dependable systems and networks, pp 389–398
Hazucha P, Svenson C (2000) Impact of CMOS technology scaling on the atmospheric neutron soft error rate. IEEE Trans Nucl Sci 47(6):2586–2594
Satoh S, Tosaka Y, Wender SA (2000) Geometric effect of multiple-bit soft errors induced by cosmic-ray neutrons on DRAMs. In: Proceedings of IEEE international electronic device meeting, pp 310–312, Jun 2000
Makhira A et al (2000) Analysis of single-ion multiple-bit upset in high-density DRAMS. IEEE Trans Nucl Sci 47(6):2400–2404
Sunita MS, Kanchana Bhaaskaran VS (2013) Matrix code based multiple error correction technique for n-bit memory data. Int JVLSI Des Commun Syst (VLSICS) 4(1):29–37
Hsiao MY (1970) A class of optimal minimum odd-weight-column SEC-DED codes. IBM J Res Dev 14:395–401
Dutta A, Touba NA (2007) Multiple bit upset tolerant memory using a selective cycle avoidance based SEC-DED-DAEC code. In: Proceedings of IEEE VLSI test symposium (VTS)
Houghton AD (1997) The engineer’s error coding handbook. Chapman and Hall, London, UK
Reddy SM (1978) A class of linear codes for error control in byte-per-package organized memory systems. IEEE Trans Comput C-27:455–458
Chen CL (1983) Error correcting codes with byte error detection capability. IEEE Trans Comput C-32:615–621
Khalid F (2011) Design error detection and correction system based on Reed_Muller matrix for memory protection. Int J Comput Appl 34(8):42–48
Hsiao MY, Bossen DC, Chien RT (1970) Orthogonal Latin square codes. IBM J Res Dev 14:390–394
Argryides C, Pradhan DK, Kocak T (2011) Matrix codes for reliable and cost efficient memory chips. IEEE Trans VLSI Syst 19:420–428
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© 2013 Springer India
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Sunita, S.M., Bhaaskaran, V.S.K., Hegde, D., Dhareshwar, P. (2013). Error Detection and Correction in Embedded Memories Using Cyclic Code. In: Chakravarthi, V., Shirur, Y., Prasad, R. (eds) Proceedings of International Conference on VLSI, Communication, Advanced Devices, Signals & Systems and Networking (VCASAN-2013). Lecture Notes in Electrical Engineering, vol 258. Springer, India. https://doi.org/10.1007/978-81-322-1524-0_16
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DOI: https://doi.org/10.1007/978-81-322-1524-0_16
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