Orientation and morphology control for a-axis YBa2Cu3Oy and PrBa2Cu3Oy thin films on SrTiO3(100) substrate
The substrate temperature and the deposition rate dependences of epitaxial growth of YBa2Cu3Oy (YBCO), PrBa2Cu3Oy (PBCO) and YBCO/PBCO/YBCO trilayer thin films on SrTiO3 (100) substrates have beer investigated by XRD, HRSEM and TEM observations. It was revealed that cubic phase films with high crystallinity was grown at relatively low substrate temperature for the Y-Ba-Cu-O, but at high deposition rate for the Pr-Ba-Cu-O systems, respectively. These cubic-phase films have been successfully utilized as buffer layers to grow high quality trilayer structures. The trilayers fabricated with the cubic-PBCO buffer layer had the best surface morphology and, furthermore, the results of XRD measurements indicated that PBCO barrier layers have b-axis orientation in which the Cu-O chain is normal to the substrate.
KeywordsBuffer Layer YBCO Film Barrier Thickness YBCO Thin Film YBCO Layer
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