Peripheral Instruments and Techniques for High-Resolution Electron Microscopy

  • Daisuke Shindo
  • Kenji Hiraga


In order to extract structure information from high-resolution images, various image processing techniques have been used. For example, noise on a high-resolution image of a crystal can be removed by over-printing with translating the image in a dark room. With an optical bench consisting of a laser beam and optical lenses, optical diffractograms of electron microscope images have been obtained, and by inserting a phase filter and a mask, image reconstruction has been carried out by modulating the phases and the ampHtudes of the scattered beams.


Electron Diffraction Pattern Incident Electron Imaging Plate Diffuse Scattering Chromatic Aberration 


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Copyright information

© Springer-Verlag Tokyo 1998

Authors and Affiliations

  • Daisuke Shindo
    • 1
  • Kenji Hiraga
    • 2
  1. 1.Institute for Advanced Materials ProcessingTohoku UniversityAoba-ku, Sendai, MiyagiJapan
  2. 2.Institute for Materials ResearchTohoku UniversityAoba-ku, Sendai, MiyagiJapan

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