Peripheral Instruments and Techniques for High-Resolution Electron Microscopy

  • Daisuke Shindo
  • Kenji Hiraga


In order to extract structure information from high-resolution images, various image processing techniques have been used. For example, noise on a high-resolution image of a crystal can be removed by over-printing with translating the image in a dark room. With an optical bench consisting of a laser beam and optical lenses, optical diffractograms of electron microscope images have been obtained, and by inserting a phase filter and a mask, image reconstruction has been carried out by modulating the phases and the ampHtudes of the scattered beams.


Electron Diffraction Pattern Incident Electron Imaging Plate Diffuse Scattering Chromatic Aberration 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer-Verlag Tokyo 1998

Authors and Affiliations

  • Daisuke Shindo
    • 1
  • Kenji Hiraga
    • 2
  1. 1.Institute for Advanced Materials ProcessingTohoku UniversityAoba-ku, Sendai, MiyagiJapan
  2. 2.Institute for Materials ResearchTohoku UniversityAoba-ku, Sendai, MiyagiJapan

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