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Abstract

On the basis of the discussions in Chaps. 1 and 2, we now consider how to observe and interpret high-resolution images, with plenty of typical examples. In Sect. 3.1, high-resolution images of various structural defects are presented and explained. X-ray diffraction and neutron diffraction provide accurate structural information averaged throughout a crystal, whereas the advantage of high-resolution electron microscopy over the diffraction methods is that it provides direct information in real space of structural defects which are localized in crystals. High-resolution electron microscopy of lattice defects such as dislocations, interfaces, and surfaces, and also structural defects in non-stoichiometric compounds are presented in this section. Section 3.2 considers the appHcation of high-resolution electron microscopy to various advanced materials such as ceramics and high-Tc superconductors. Structural changes in alloys due to heat treatment and slight compositional changes, and the characteristic structural features of quasicrystals are also explained in detail.

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Shindo, D., Hiraga, K. (1998). Application of High-Resolution Electron Microscopy. In: High-Resolution Electron Microscopy for Materials Science. Springer, Tokyo. https://doi.org/10.1007/978-4-431-68422-0_3

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  • DOI: https://doi.org/10.1007/978-4-431-68422-0_3

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  • Print ISBN: 978-4-431-70234-4

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