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Practice of High-Resolution Electron Microscopy

  • Daisuke Shindo
  • Kenji Hiraga

Abstract

As mentioned in Chap. 1, high-resolution images are the phase contrast formed by the interference of the transmitted and diffracted beams passing through the back focal plane, so various high-resolution images containing different information may be obtained depending on their scattering amplitudes, which are affected by the diffraction conditions and the crystal thicknesses. Thus, before observing high-resolution images, we should clarify what structural information we need and what experimental conditions we should set up to get such information.

Keywords

Electron Diffraction Pattern Structure Image Lattice Image Lattice Fringe Amorphous Film 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Tokyo 1998

Authors and Affiliations

  • Daisuke Shindo
    • 1
  • Kenji Hiraga
    • 2
  1. 1.Institute for Advanced Materials ProcessingTohoku UniversityAoba-ku, Sendai, MiyagiJapan
  2. 2.Institute for Materials ResearchTohoku UniversityAoba-ku, Sendai, MiyagiJapan

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