Transport Anisotropy in BSCCO Thin Films
We measured anisotropic transport properties in Bi2Sr2CaCu2Ox single crystalline films. The samples in this experiments were epitaxially grown on inclined SrTiO3 substrate by using ion beam sputtering technique. According to the inclination, the c-axis of the film makes non-zero angle to the substrate surface normal. For such film, the transport current traverses the BiO layers in certain direction. The I-V curves involving the Bi-O interlayer transport showed a rather RSJ like I-V characteristics without obvious excess current. The IcR was about 9–15mV per layer. However no ac nor dc Josephson effect was observed in our experimental condition. The voltage near Ic seemed to be generated by the flux dynamics.
KeywordsCritical Current Josephson Effect Bulk Single Crystal Voltage Jump Anisotropic Transport
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