Advertisement

Transport Anisotropy in BSCCO Thin Films

  • Jun-Ichi Fujita
  • Jaw-Shen Tsai
  • Hisanao Tsuge
Conference paper

Abstract

We measured anisotropic transport properties in Bi2Sr2CaCu2Ox single crystalline films. The samples in this experiments were epitaxially grown on inclined SrTiO3 substrate by using ion beam sputtering technique. According to the inclination, the c-axis of the film makes non-zero angle to the substrate surface normal. For such film, the transport current traverses the BiO layers in certain direction. The I-V curves involving the Bi-O interlayer transport showed a rather RSJ like I-V characteristics without obvious excess current. The IcR was about 9–15mV per layer. However no ac nor dc Josephson effect was observed in our experimental condition. The voltage near Ic seemed to be generated by the flux dynamics.

Keywords

Critical Current Josephson Effect Bulk Single Crystal Voltage Jump Anisotropic Transport 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. [1]
    K.Kadowaki, A.A.Menovsky, and J.J.M.Franse, Phys Rev.Lett. 59, 1160 (1992)Google Scholar
  2. [2]
    G.Brinceno, M.F.Crommie, and A.Zettl, Phys.Rev. Lett. 66, 2164 (1991)CrossRefGoogle Scholar
  3. [3]
    Y.Koike, T.Nakanomyo, and T.Fukase, JpnJ.Appl.Phys. 27. L841 (1988)CrossRefGoogle Scholar
  4. [4]
    R.Kleiner, F.Steinmeyer, G.Kunkel, and P.Muller, Phys.Rev.Lett. 68, 2394 (1992)CrossRefGoogle Scholar
  5. [5]
    J.S.Tsai, J.Fujita, Proceedings of Applied Sperconducting Conference, 1992 (in press).Google Scholar
  6. [6]
    J.Fujita, T.Yositake, T.Satoh, and H. lgarashi. lEEE Trans.Mag. 27, 1205 (1991)Google Scholar
  7. [7]
    Y. lye, Physica C174, 227 (1991)Google Scholar
  8. [8]
    L.N.Bulaevskii, J.R.Clem, ans L.I.GIazman, Phys Rev. B46, 350 (1992).Google Scholar

Copyright information

© Springer-Verlag Tokyo 1993

Authors and Affiliations

  • Jun-Ichi Fujita
    • 1
  • Jaw-Shen Tsai
    • 1
  • Hisanao Tsuge
    • 1
  1. 1.Fundamental Research LaboratoriesNEC Corp.Tsukuba, Ibaraki, 305Japan

Personalised recommendations