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Surface Impedance Measurements of YBa2Cu3O7−x Thin Films in Stripline Resonators

  • D. E. Oates
  • Alfredo C. Anderson

Abstract

Microwave surface impedance of thin films of YBa2Cu3O7−x deposited by a single-target off-axis magnetron sputtering technique was measured as a function of temperature, frequency and if magnetic field, Hrf using a stripline resonator. The measurements included determination of the penetration depth λ, equal to 0.167 µm the best film. The surface resistance Rs was measured over a frequency range of 0.4 to 20 GHz; the temperature range was 4.2 K to Tc, and the Hrf ranged from 0 to 225 Oe. The Rs at 4.2 K and 1.5 GHz is 4.5 × 10−6 Ω. We observed that Rs(Hrf) depends upon the conditions under which the films were deposited. Films deposited at low temperature show a linear dependence on Hrf and those deposited at high temperature show a weak dependence upon on Hrf. All films show a rapid rise in Rs at high values of Hrf.The shape of Rs(Hrf) is similar to that of Nb and NbN films measured in the same stripline geometry. We propose that Rs(Hrf) is related to the grain structure of the films. We have measured intermodulation products in these resonators. Films showing weak dependence of Rs on Hrf demonstrate smaller intermodulation effects. We discuss the implications for microwave device applications.

Keywords

Penetration Depth Weak Dependence Surface Impedance Surface Resistance Center Conductor 
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References

  1. 1.
    See for example Lyons WG, Bonetti RR, Williams AE, Mankewich PM, O’Malley ML, Anderson AC, Withers RS, and Howard RE (in press) Proceedings of 1990 App. Superconductivity ConferenceGoogle Scholar
  2. 2.
    Klein N, Müller G, Piel H, Roas B, Schultz L, Klein U, Peiniger M (1989) Appl. Phys. Lett. 54: 757ADSCrossRefGoogle Scholar
  3. 3.
    Rubin DL, Green K, Gruschus J, Kirchgessner J, Moffat D, Padamsee H, Sears J, Shu QS, Schneemeyer LF, Waszczak JV (1988) Phys. Rev. B 38: 6538ADSCrossRefGoogle Scholar
  4. 4.
    Oates DE, Anderson AC, Mankiewich, PM (1990) J Superconductivity 3: 251ADSCrossRefGoogle Scholar
  5. 5.
    Sheen D, Ali S, Oates DE, Withers RS (unpublished)Google Scholar
  6. 6.
    Steinbeck JW, Holtham JH (unpublished)Google Scholar
  7. 7.
    Oates DE (unpublished)Google Scholar
  8. 8.
    Mankiewich PM, Scofield JH, Skocpol WJ, Howard RE, Dayem AH, Good E (1987) Appl. Phys. Lett. 51: 1753ADSCrossRefGoogle Scholar
  9. 9.
    Anderson AC, Oates DE, Slattery RL, Lyons WG, Solid State Research Report Lincoln Laboratory MIT 1990: 1: 60Google Scholar
  10. 10.
    Anlage SM, Langly BW, Snortland HJ, Eom EB, Geballe TH, Beasley MR (in press) J SuperconductivityGoogle Scholar
  11. 11.
    Oates DE, Anderson AC (in press) Proceedings of 1990 Appl. Superconductivity ConferenceGoogle Scholar
  12. 12.
    Mattick, RE (1969) Transmission lines for digital and communication networks. McGraw-Hill. New YorkGoogle Scholar
  13. 13.
    Inam A., Wu XD, Nazar L, Hegde MS, Rogers CT, Venkatesan T, Simon RW, Daly K, Padamsee J, Kirchgessner D, Moffat D, Rubin D, Shu SQ, Kalokitis D, Fathy A, Pendrick V, Brown R, Brycki B, Belohoubek E, Drabeck L, Gruner G, Hammond R, Gamble F, Larison BM, Bravman JC (1990) Appl. Phys. Lett. 56: 1178ADSCrossRefGoogle Scholar
  14. 14.
    Halbritter J (unpublished)Google Scholar
  15. 15.
    Newman N, Char K, Garrison SM, Barton RW, Taber RC, Emo CB, Geballe TH, Wilkens D (1990) Appl. Phys. Lett. 57: 520ADSCrossRefGoogle Scholar
  16. 16.
    Hylton TL, Beasley MR, (1989) Phys. Rev. B 13: 9042ADSCrossRefGoogle Scholar
  17. 17.
    Oates DE, Anderson AC, Shin BH (1989) MTT-S Digest: 627Google Scholar

Copyright information

© Springer-Verlag Tokyo 1991

Authors and Affiliations

  • D. E. Oates
    • 1
  • Alfredo C. Anderson
    • 1
  1. 1.Lincoln LaboratoryMassachusetts Institute of TechnologyLexingtonUSA

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