Microstructural Development in Ion Beam Deposited Superconducting YBa2Cu3O7-x and Bi-Ca-Sr-Cu-O Thin Films
The microstructural development of superconducting thin films in the Y-Ba-Cu-O (YBCO) and Bi-Ca-Sr-Cu-O (BCSCO) systems has been observed by transmission electron microscopy as a function of ion beam deposition and annealing conditions. 100 nm thick YBCO samples deposited between 580 and 650°C on SrTiO3 and MgO were found to be single crystal with c-axis normal orientation. Higher temperature deposition or annealing to improve the oxygen stoichiometry and critical properties enhanced microstructure development and produced grain oriented polycrystalline material. In the BCSCO system, the 85K superconducting phase is formed by recrystallization from a non-superconducting phase and exhibits c-axis normal grain orientation even on polycrystalline substrates. Device structures have been prepared from these materials which show the presence of at least two distinct types of weak link behavior associated with the grain boundaries in the superconductors.
KeywordsYBCO Film Oxygen Stoichiometry High Temperature Deposition Moire Fringe Polycrystalline Substrate
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- 2.I.S. Gergis, J.A. Titus, P.H. Kobrin, and A.B. Harker, submitted Appl. Phys. Lett. (1988).Google Scholar
- 3.P.H. Kobrin, J.F. DeNatale, R.M. Housley, J.F. Flintoff, and A.B. Harker, Advanced Ceramic Materials, Vol. 2(3B), 430(1987).Google Scholar
- 5.J.F. DeNatale and A.B. Harker, to be submitted J. Elect. Micro. Tech. (1988).Google Scholar