New Experimental Results Concerning the Difference Between Various TcS of LnBa2Cu3Oy (Ln=Lanthanide))

  • Tsunekazu Iwata
  • Makoto Hikita
  • Shigeyuki Tsurumi


The superconducting properties of a sample with large ion radius lanthanide is improved by high temperature annealing. This result is considered to be due to improved atomic ordering in the sample. However, high temperature annealing causes the production of impurity phases such as BaCuCO2 Annealing in Ar atmosphere was studied to obtain single phase LnBa2Cu3Oy.

It is found that the superconducting critical temperature (T c ) of LnBa2Cu3Oy (Ln = Lanthanide) changes systematically from 88 K to 96 K depending on the melting temperature of the substance. The small changes in T c for LnBa2Cu3Oy are considered to be due to changes in its Debye temperature.


Melting Temperature Differential Thermal Analysis Impurity Phase High Temperature Annealing Electron Probe Micro Analyzer 
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  1. [1]
    for example, S.Tsurumi, T.Iwata, Y.Tajima, and M.Hikita, Jpn. J. Appl. Phys. 26, L1865 (1987).ADSCrossRefGoogle Scholar
  2. [2]
    T. Iwata, M. Hikita, Y. Tajima, and S. Tsurumi, J. Cryst. Growth 85, 661 (1987).ADSCrossRefGoogle Scholar
  3. [3]
    T. Iwata, M. Hikita, Y. Tajima, and S. Tsurumi, Jpn. J. Appl. Phys., 26, L2049 (1987).ADSCrossRefGoogle Scholar
  4. [4]
    T. Iwata, M. Hikita, and S. Tsurumi, Proc. Int. Conf. Erectorical Materials ( Tokyo ) 1988, to be published.Google Scholar
  5. [5]
    S. Tsurumi, T. Iwata, Y. Tajima, and M. Hikita, Jpn. J. Appl. Phys., 27, L397 (1988).ADSCrossRefGoogle Scholar
  6. [6]
    M. Hikita, Y. Tajima, A. Katsui, Y. Hidaka, T. Iwata, and S. Tsurumi, Phys. Rev. B 36, 7199 (1987).ADSCrossRefGoogle Scholar
  7. [7]
    F.Izumi, nihon kessyou gakkai shi, 27, 23 (1985) [ in Japanese ].Google Scholar
  8. [8]
    T. Wada, N. Suzuki, T. Maeda, A. Maeda, S. Uchida, K. Uchinokura, and S. Tanaka, Appl. Phys. Lett. 52, 1989 (1988).ADSCrossRefGoogle Scholar
  9. [9]
    T. Tamegai, A. Watanabe, I. Oguro, and Y. Iye, Jpn. J. Appl. Phys. 26, L1304 (1987)ADSCrossRefGoogle Scholar
  10. [10]
    J. M. Tarascon, W. R. McKinnon, L. H. Greene, G. W. Hull, and E. M. Vogel, Phys Rev. B 36, 226 (1987).ADSCrossRefGoogle Scholar
  11. [11]
    F. Lindemann, Phys. z., 11, 609 (1910).MATHGoogle Scholar

Copyright information

© Springer Japan 1989

Authors and Affiliations

  • Tsunekazu Iwata
    • 1
  • Makoto Hikita
    • 1
  • Shigeyuki Tsurumi
    • 1
  1. 1.NTT Opto-Electronics LaboratoriesTokai, Ibaraki, 319-11Japan

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