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Structural Investigation of High Tc Bi-Sr-Ca-Cu-O

  • Masaaki Matsui
  • Hajime Itoh
  • Jun Liu
  • Toshifumi Shimizu
  • Hiroshi Matsuoka
  • Kazuhiko Ohmori
  • Masao Doyama
Conference paper

Abstract

High temperature X-ray diffraction, electrical resistivity and susceptibility measurements have been made for the Bi-Sr-Ca-Cu-0 system of 1:1:1:2, 2:2:1:2 and 2:2:2:3 in the nominal composition ratio of Bi:Sr:Ca:Cu and for the system of 2:2:2:3 doped with Pb. No structural change has been observed in the temperature range from R.T. to 1123K for samples except for 1:1:1:2, where some extra peaks have appeared between 923K and 1073K. The crystal structure of a high Tc phase (Tcon=115K, Tczero=110K) in the Pb-doped sample is tetragonal with a=b=3.82 A and c=37.22 Å at R.T.. The temperature dependence of lattice parameters of the low Tc phase for undoped samples and of the high Tc phase for Pb-doped samples have been obtained. The mean thermal expansion coefficient between R.T. and 1100K of c-axis of the high Tc phase is 2.9x10-5 K-1 which is larger than that of low Tc phase.

Keywords

Electrical Resistivity Thermal Expansion Coefficient Lattice Spacing Undoped Sample Extra Peak 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Japan 1989

Authors and Affiliations

  • Masaaki Matsui
    • 1
  • Hajime Itoh
    • 1
  • Jun Liu
    • 1
  • Toshifumi Shimizu
    • 1
  • Hiroshi Matsuoka
    • 1
  • Kazuhiko Ohmori
    • 1
  • Masao Doyama
    • 1
  1. 1.Department of Iron and Steel Engineering, Faculty of EngineeringNagoya UniversityFuro-cho, Chikusa-ku, NagoyaJapan

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