The Formation of High-Tc Superconducting Phases with Four Cu-O Layers in Tl-Ca-Ba-Cu-O Systems

  • P. T. Wu
  • R. S. Liu
  • J. M. Liang
  • L. J. Chen
Conference paper


Zero-resistance at temperatures up to 162 K was recorded for multiphase samples with nominal composition TlCa4Ba3Cu6Ox. The compound with Tc-zero higher than 140 K was found to be highly repeatable. The compound was tentatively identified to be TlCa2Ba3Cu4Ox, tetragonal in structure with a=b=0.394 nm and c=3.95 nm and of P4/mcc space group by TEM and EDS analysis. High resolution TEM images showed that the phase is primarily of a ten-subcell structure which is consistent with a structure model with four Cu-O layers interposed between Tl-O layers. Polytype structures, consisting of four-and five-subcell structures were also observed. The five-subcell structure was identified to be of P4/mmm space group with a=b=0.394 nm and c=1.97 nm.


Energy Dispersive Spectrometer Lattice Image Furnace Cool Energy Dispersive Spectrometer Analysis Industrial Technology Research Institute 


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. [1]
    Z.Z. Sheng and A.M. Hermann, Nature 332, 55 (1988).ADSCrossRefGoogle Scholar
  2. [2]
    Z.Z. Sheng and A.M. Hermann, Nature 332, 138 (1988).ADSCrossRefGoogle Scholar
  3. [3]
    R.S. Liu, W.H. Lee, P.T. Wu, Y.C. Chen and C.T. Chang, Jpn. J. Appl. Phys. 27, L1206 (1988).ADSCrossRefGoogle Scholar
  4. [4]
    Z.Z. Sheng, W. Kiehl, J. Bennett, A. El Ali, D. Marsh, G.D. Money, F. Arammash, J. Smith, D. Viar, and A.M. Hermann, Appl. Phys. Lett. 52, 1738 (1988).ADSCrossRefGoogle Scholar
  5. [5]
    P.T. Wu, R.S. Liu, J.M. Liang, W.H. Lee, L. Chang, L.J. Chen and C.T. Chang, Physica C 156, 109 (1988).ADSCrossRefGoogle Scholar
  6. [6]
    L. Gao, Z.J. Huang, R.L. Meng, P.H. Hor, J. Bechtold, Y.Y. Sun, C.W. Chu, Z.Z. Sheng, and A.M. Hermann, preprint.Google Scholar
  7. [7]
    A.M. Hermann, Z.Z. Sheng, D.C. Vier, S. Schultz, and S.B. Oseroff, preprint.Google Scholar
  8. [8]
    M. Kikuchi, N. Kobayashi, H. Iwasaki, D. Shindo, T. Oku, A. Tokiwa, T. Kajitani, K. Hiraga, Y. Syono, and Y. Muto, Jpn. J. Appl. Phys. 27, L1050 (1988).ADSCrossRefGoogle Scholar
  9. [9]
    S. Iijima, T. Ichihashi, and Y. Kubo, Jpn. J. Appl. Phys. 27, L817 (1988).ADSCrossRefGoogle Scholar
  10. [10]
    A.O. Sandborg, R.B. Shen, and S.G. Maegdlin, The EDAX EDITOR, 10–3, 11 (1980).Google Scholar
  11. [11]
    International Tables for Crystallography, vol. A, edited by T. Hahn (D. Reidel, Dordrecht, Holland, 1983).Google Scholar
  12. [12]
    S.S. Parkin, V.Y. Lee, E.M. Engler, A.I. Nazzal, T.C. Huang, G. Gorman, R. Savoy, and R. Beyers, Phys. Rev. Lett. 60, 2539 (1988).ADSCrossRefGoogle Scholar
  13. [13]
    R.M. Hazen, L.W. Finger, R.J. Angel, CT. Prewitt, N.L. Ross, C.G. Hadidiacos, P.J. Heaney, D.R. Veblen, Z.Z. Sheng, A. El Ali, and A.M. Hermann, Phys. Rev. Lett. 60, 1657 (1988).ADSCrossRefGoogle Scholar
  14. [14]
    J.M. Liang, unpublished work.Google Scholar
  15. [15]
    R. Poole, Science 240, 146 (1988).ADSCrossRefGoogle Scholar

Copyright information

© Springer Japan 1989

Authors and Affiliations

  • P. T. Wu
    • 1
  • R. S. Liu
    • 1
  • J. M. Liang
    • 1
  • L. J. Chen
    • 2
  1. 1.Materials Research LaboratoriesIndustrial Technology Research InstituteChutung, HsinchuTaiwan
  2. 2.Department of Materials Science and EngineeringNational Tsing Hua UniversityHsinchuTaiwan

Personalised recommendations