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Energy Gap Measurement Made on “Clean” and Oriented YBa2Cu3O7-δ Surfaces

  • Jaw-Shen Tsai
  • Ichiro Takeuchi
  • Junichi Fujita
  • Tsutomu Yoshitake
  • Tetsuro Sato
  • Shinichi Tanaka
  • Takahito Terashima
  • Yoshichika Bando
  • Kenji Iijima
  • Kazunuki Yamamoto
Conference paper

Abstract

Superconductive energy gap of YBa2Cu3O7-δ is measured in a novel broken film edge junction. (001), (103) and (110) oriented films are broken in a cryogenic environment along the appropriate directions together with the SrTiO3 substrate. Pb electrode is brought close in situ to the clean broken film edge. The normalized energy gap 2Δ(0)/kBTc measured in the direction along and perpendicular to the Cu-O plane are found to be 5.9±0.2 and 3.6±0.2 respectively. These values are independent of the variation in the values of Tc within the examined range of 40K~90K. The gap difference structure at ΔYBCOpb is observed which help identifying the value of energy gap of the oxide superconductor unambiguously. Identification of the gap energies in BiSrCaCuO system by the same technique was attempted.

Keywords

Tunnel Junction Oxide Superconductor Josephson Current Film Edge Tunneling Surface 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. [1]
    T.K. Worthington, W.J. Gallagher and T.R. Dinger Phys. Rev. Lett. 59, 1160 (1987)ADSCrossRefGoogle Scholar
  2. [2]
    Y. Enomoto, T. Murakami, M. Suzuki and K. Moriwaki, Jpn. J. Appl. Phys. 26, L1248 (1987)ADSCrossRefGoogle Scholar
  3. [3]
    H. Ebisawa, Y. Isawa and S. Maekawa, Jpn. J. Appl. Phys. 26, L992, (1987)ADSCrossRefGoogle Scholar
  4. [4]
    J.R. Kirtley, W.J. Gallagher, Z. Schlesinger, R.L. Sandstrom, T.R. Dinger and D.A. Chance, 1987, preprint. Phys. Rev. B35, 8846 (1987)ADSGoogle Scholar
  5. [4a.]
    Z. Schlesinger, R.T. Collins, D.L. Kaiser, and F. Holtzberg, Phys. Rev. Lett. 59, 1958 (1987)ADSCrossRefGoogle Scholar
  6. [5]
    A. Barone, Physica C, 153–155, 1712 (1988)Google Scholar
  7. [6]
    J. Fujita, T. Yoshitake, A. Kamijyo, H. Igarashi and T. Satoh, to be published, Extended Abstracts MRS Spring Meeting (1988)Google Scholar
  8. [7]
    T. Terashima, K. Iijima, K. Yamamoto, Y. Bando and H. Mazaki, Jpn. J. Appl. Phys. 27, L9l, (1988)CrossRefGoogle Scholar
  9. [8]
    J. Takada, H. Mazaki, T. Terashima, K. Iijima, K. Yamamoto, K. Hirata and Y. Bando, Extended Abstracts of the 20th Conference on Solid State Devices and Materials, Tokyo, 455 (1988)Google Scholar
  10. [9]
    G. Binnig and H.E. Hoenig, Z. Physik. B32, 23 (1978)ADSGoogle Scholar
  11. [10]
    G. Deutscher and K.A. Müller, Phys. Rev. Lett. 59, 1745 (1987)ADSCrossRefGoogle Scholar
  12. [11]
    S. Han, K.W. Ng, E.L. Wolf, A. Millis, J.L. Smith and Z. Fisk, Phys. Rev. Lett. 57, 238 (1986)ADSCrossRefGoogle Scholar
  13. [12]
    T. Yoshitake, T. Satoh, Y. Kubo and A. Igarashi, Jpn. J. Appl. Phys . 27, L1089 and L1262 (1988)ADSCrossRefGoogle Scholar

Copyright information

© Springer Japan 1989

Authors and Affiliations

  • Jaw-Shen Tsai
    • 1
  • Ichiro Takeuchi
    • 1
  • Junichi Fujita
    • 2
  • Tsutomu Yoshitake
    • 2
  • Tetsuro Sato
    • 3
  • Shinichi Tanaka
    • 1
  • Takahito Terashima
    • 4
  • Yoshichika Bando
    • 4
  • Kenji Iijima
    • 5
  • Kazunuki Yamamoto
    • 5
  1. 1.Microelectronics Research LaboratoriesNEC CorporationKawasaki, 213Japan
  2. 2.Fundamental Research LaboratoriesNEC CorporationKawasaki, 213Japan
  3. 3.Resources and Environment Protection Research LaboratoriesNEC CorporationKawasaki, 213Japan
  4. 4.Institute for Chemical ResearchKyoto UniversityUji, 611Japan
  5. 5.Research Institute for Production DevelopmentKyoto, 606Japan

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