Characteristics in the Growth of the YBa2Cu3Ox and YBaSrCu3Ox Crystalline Films
The change of the structure of the sputter-deposited amorphous films of YBa2Cu3Ox and YBaSrCu3Ox by the thermal annealing was investigated using the SEM and the X-ray diffraction spectrometry. The YBa2Cu3Ox films crystallized in the distorted perovskite structure when annealed above 920°C while the YBaSrCu3Ox above 980°c The merging of (200), (020) and (006) lines was observed in the YBa2Cu3Ox annealed at 800°C or in the YBaSrCu3Ox annealed between 800°C and 940°C. The existence of the antistructure defects between Y and Ba (Sr) was pointed out in these films. It was also found that by the annealing of the films of YBaSrCu3Ox , the YBa2Cu3Ox crystals grew preferentially below 900C while the YBaSrCu3Ox crystals grew above 900°C.
KeywordsDiffraction Line Orthorhombic Phase Oriented Growth Maximum Annealing Temperature Distorted Perovskite Structure
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- F. A. Kroger, The Chemistry of Imperfect Crystals, (Wiley, New York, 1984) p406.Google Scholar