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Properties of High Jc BiSrCaCuO Thin Film

  • H. Itozaki
  • K. Higaki
  • K. Harada
  • S. Tanaka
  • N. Fujimori
  • S. Yazu

Abstract

BiSrCaCuO thin films were grown on MgO substrate by an RF magnetron sputtering. Its Jc was 1.9 million A/cm2 at 77.3K and 21 million A/cm2 at 40K. Anisotropic degradation of Jc was observed. In the most severe case, Jc decreased to 0.1 million A/cm2 as applied magnetic field increased to only 0.5 Tesla. X-ray analysis showed that this film consists of almost single high Tc 2223 phase with c=37.2A. RHEED, SEM and TEM observation showed that this high Jc thin film was c axis oriented polycrystalline. The grain boundaries and stacking faults were not barriers for supercurrent to flow but they might act as pinning places for magnetic flux.

Keywords

Critical Current Density RHEED Pattern Post Annealing Temperature Annealed Thin Film Single Crystal Thin Film 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Japan 1989

Authors and Affiliations

  • H. Itozaki
    • 1
  • K. Higaki
    • 1
  • K. Harada
    • 1
  • S. Tanaka
    • 1
  • N. Fujimori
    • 1
  • S. Yazu
    • 1
  1. 1.Sumitomo Electric Industries Ltd.Itami, 664Japan

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