To perform a near-field optical microscopy (NOM) application such as optical imaging of nanometric biological specimens and spatially resolved spectroscopy of optical devices, one has to fabricate a nanometric probe which works a sensitive scatterer and/or a selective generator of high spatial frequency components of a localized optical near field. NOM employing a scatterer-type probe and a generator-type probe are defined as collection-mode (c-mode) NOM and illumination-mode (i-mode) NOM,1 respectively. Instruments of i-mode NOM and c-mode NOM will be described in Chap. 6. For illumination-collection hybrid mode (i-c mode) NOM,2 one requires a probe functioning as both a generator and a scatterer of the optical near field.


Cone Angle Selective Etching Tapered Fiber Dispersion Compensate Fiber Tapered Probe 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    D. W. Pohl, W. Denk, M. Lanz, Appl. Phys. Lett. 44, 651 (1984)ADSCrossRefGoogle Scholar
  2. 2.
    K. Lieberman, S. Harush, A. Lewis, R. Kopelman Science 247, 59 (1990)Google Scholar
  3. 3.
    D. R. Turner, US Patent, 4,469,554 (1983); K. M. Takahashi, J. Colloid Interface Sci. 134, 181 (1990)Google Scholar
  4. 4.
    T. Hartmann, R. Gatz, W. Wiegräbe, A. Kramer, A. Hillebrand, K. Lieberman, W. Baumeister, R. Guckenberger, in Near field optics, Vol. 242, NATO ASI series E, pp. 35–44 (Kluwer, Dordrecht, 1993)CrossRefGoogle Scholar
  5. 5.
    J. Radojewski, N. Stonik, H. Paginia, International J. Electron. 76, 973 (1994)CrossRefGoogle Scholar
  6. 6.
    P. Hoffmann, B. Dutoit, R.-P. Salathé, Ultramicroscopy 61, 165 (1995)CrossRefGoogle Scholar
  7. 7.
    S. Jiang, H. Ohsawa, K. Yamada, T. Pangaribuan, M. Ohtsu, K. Imai, A. Ikai, Jpn. J. Appl. Phys. 31, 2282 (1992)ADSCrossRefGoogle Scholar
  8. 8.
    T. Pangaribuan, K. Yamada, S. Jiang, H. Ohsawa, M. Ohtsu, Jpn. J. Appl. Phys. 31, L1302 (1992)ADSCrossRefGoogle Scholar
  9. 9.
    T. Pangaribuan, S. Jiang, M. Ohtsu, Electron. Lett. 29, 1978 (1993); T. Pangaribuan, S. Jiang, M. Ohtsu, Scanning 16, 362 (1994)CrossRefGoogle Scholar
  10. 10.
    R. Uma Maheswari, S. Mononobe, M. Ohtsu, J. Lightwave Technol. 13, 2308 (1995)ADSCrossRefGoogle Scholar
  11. 11.
    P. Tomanek, in Near field optics, Vol. 242, NATO ASI series E, pp. 87–96 (Kluwer, Dordrecht, 1993)Google Scholar
  12. 12.
    E. Betzig, in Near field optics, Vol 242, NATO ASI series E, pp. 7–15 (Kluwer, Dordrecht, 1993); E. Betzig, J. K. Trautman, Science 257, 189 (1992)CrossRefGoogle Scholar
  13. 13.
    G. A. Valaskovic, M. Holton, G. H. Morrison, Appl. Opt. 34, 1215 (1995)ADSCrossRefGoogle Scholar
  14. 14.
    M. Garcia-Parajo, T. Tate, Y. Chen, Ultramicroscopy 61, 155 (1995)CrossRefGoogle Scholar
  15. 15.
    M. Spajor, A. Jalocha, in Near field optics, Vol. 242, NATO ASI series E, pp. 87–96 (Kluwer, Dordrecht, 1993)CrossRefGoogle Scholar
  16. 16.
    S. Mononobe, T. Saiki, R. Uma Maheswari, T. Suzuki, S. Koshihara, H. Miyazaki, M. Ohtsu, Opt. ExpressGoogle Scholar
  17. 17.
    S. Mononobe, M. Naya, R. Uma Maheswari, T. Saiki, M. Ohtsu, in Near field optics and related techniques, Vol. 8, EOS Topical Meeting Digest series, pp. 105–106 (European Optical Society, Orsay, 1995)Google Scholar
  18. 18.
    S. Mononobe, M. Ohtsu, J. Lightwave Technol. 14, 2231 (1996); Erratum J. Lightwave Technol. 15, 162 (1997)ADSCrossRefGoogle Scholar
  19. 19.
    S. Mononobe, M. Ohtsu, J. Lightwave Technol. 15 1051 (1997)ADSCrossRefGoogle Scholar
  20. 20.
    B. I. Yakobson, A. LaRosa, H. D. Hallen, M. A. Paesler, Ultramicroscopy 61, 179 (1995); M. Paesler, P. Moyer, in Near-field optics: theory, instrumentation, and applications, pp. 46–53 (Wiley-Interscience, New York, 1996)CrossRefGoogle Scholar
  21. 21.
    V. Kurpas, M. Libenson, G. Martsinovsky, Ultramicroscopy 61, 187 (1995)CrossRefGoogle Scholar
  22. 22.
    M. Stähelin, M. A. Bopp, G. Tarrach, A. J. Meixner, I. Zschokke-Gränacher, Appl. Phys. Lett. 68, 2603 (1996)ADSCrossRefGoogle Scholar
  23. 23.
    S. Mononobe, M. Naya, T. Saiki, M. Ohtsu, Appl. Opt. 36, 1496 (1997)ADSCrossRefGoogle Scholar
  24. 24.
    T. Saiki, S. Mononobe, M. Ohtsu, N. Saito, J. Kusano, Appl. Phys. Lett. 68, 2612 (1996)ADSCrossRefGoogle Scholar
  25. 25.
    S. Mononobe, T. Saiki, T. Suzuki, S. Koshihara, M. Ohtsu, Opt. Commun. 126, 45 (1998)ADSCrossRefGoogle Scholar
  26. 26.
    S. Mononobe, M. Ohtsu, IEEE Photon. Technol. Lett. 10, 99 (1998)ADSCrossRefGoogle Scholar
  27. 27.
    S. Mononobe, R. Uma Maheswari, M. Ohtsu, Opt. Express 1, 229 (1997), http://epubs.osa.org/opticsexpress/ADSCrossRefGoogle Scholar
  28. 28.
    T. Izawa, S. Sudo, in Optical fibers: materials and fabrication (KTK Scientific, Tokyo, 1987)Google Scholar
  29. 29.
    T. Matsumoto, M. Ohtsu, J. Lightwave Technol. 14, 2224 (1996)ADSCrossRefGoogle Scholar

Copyright information

© Springer Japan 1998

Authors and Affiliations

  • Motoichi Ohtsu
    • 1
  1. 1.Interdisciplinary Graduate School of Science and EngineeringTokyo Institute of TechnologyMidori-ku YokohamaJapan

Personalised recommendations