As mentioned in Chap. 1, the principle of the near-field optical microscope (NOM) is short-range electromagnetic interaction between two antennas, a probe antenna and a sample antenna, which are much smaller than the wavelength of driving field. It is apparent that the fabrication and manipulation of the small antenna are the most important factors for the successful development of NOM. One of the most realistic and commonly used method for the preparation of the small antenna is sharpening an optical fiber to a very small apex. By employing the scanning technique already established in scanning tunneling microscope (STM) and atomic force microscope (AFM), the antenna at the apex of sharpened fiber works as a probe on a sample surface under precise distance control. The following sections contain the principal roles of the basic probe relating to the functions of each part of the probe.


Scanning Tunneling Microscope Cone Angle Wavelength Conversion Signal Profile Functional Probe 


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Copyright information

© Springer Japan 1998

Authors and Affiliations

  • Motoichi Ohtsu
    • 1
  1. 1.Interdisciplinary Graduate School of Science and EngineeringTokyo Institute of TechnologyMidori-ku YokohamaJapan

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