Abstract
Electron diffraction is fundamentally one of the most important methods for obtaining crystallographic information about materials. The information obtained by electron diffraction is the quantity in reciprocal space, which is the same as that attained by X-ray diffraction and neutron diffraction. Although the intensity of X-ray diffraction and neutron diffraction directly corresponds to the square of an absolute value of the structure factor according to the kinematical diffraction theory, the intensity of electron diffraction should be interpreted on the basis of the dynamical diffraction theory. The dynamical diffraction effect on electron diffraction is explained in the literature [1-3]. In this chapter we discuss the principles and application of nano-beam electron diffraction and convergent beam electron diffraction, which extensively utilize the function of an analytical electron microscope.
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Shindo, D., Oikawa, T. (2002). Peripheral Instruments and Techniques for Analytical Electron Microscopy. In: Analytical Electron Microscopy for Materials Science. Springer, Tokyo. https://doi.org/10.1007/978-4-431-66988-3_5
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DOI: https://doi.org/10.1007/978-4-431-66988-3_5
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-70336-5
Online ISBN: 978-4-431-66988-3
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