Abstract
The constitution, functions, and principles of an analytical electron microscope are explained in this chapter. For observing electron microscope images and diffraction patterns and for carrying out various extensive analyses, it is important to set an analytical electron microscope to be in optimal operating condition by learning the principles of its constituent units and its appropriate operating method. Here, the basic configuration of a transmission electron microscope is noted first, and its constituent units are described in turn. Alignment of various lens axes and adjustment of their astigmatism are explained based on these explanations.
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Shindo, D., Oikawa, T. (2002). Constitution and Basic Operation of Analytical Electron Microscopes. In: Analytical Electron Microscopy for Materials Science. Springer, Tokyo. https://doi.org/10.1007/978-4-431-66988-3_2
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DOI: https://doi.org/10.1007/978-4-431-66988-3_2
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-70336-5
Online ISBN: 978-4-431-66988-3
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