Abstract
Scanning electron microscopy (SEM), an important member of the electron microscopy family, is a versatile instrument widely used in various fields such as nanotechnology, biology, and the life sciences for imaging of micro- and nanostructure morphology and characterizations of chemical composition of various materials.
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Jiang, X., Higuchi, T., Jinnai, H. (2019). Scanning Electron Microscopy. In: Maeda, M., Takahara, A., Kitano, H., Yamaoka, T., Miura, Y. (eds) Molecular Soft-Interface Science. Springer, Tokyo. https://doi.org/10.1007/978-4-431-56877-3_9
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DOI: https://doi.org/10.1007/978-4-431-56877-3_9
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