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Radiation-Induced Soft Errors

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VLSI Design and Test for Systems Dependability

Abstract

We will begin by a quick but thorough look at the effects of fault s, error s and failure s, caused by terrestrial neutron s originating from cosmic rays , on the terrestrial electronic systems in the variety of industries. Mitigation measures, taken at various levels of design hierarchy from physical to systems level against neutron-induced adverse effects, are then introduced. Challenges for retaining robustness under future technology development are also discussed. Such challenges in mitigation approaches are featured for SRAMs (Static Random Access Memories), FFs (Flip-Flops), FPGAs (Field Programmable Gate Arrays) and computer systems as exemplified in the following articles: (i) Layout aware neutron-induced soft-error simulation and fault tolerant design techniques are introduced for 6T SRAMs. The PNP layout instead of conventional NPN layout is proposed and its robustness is demonstrated by using the MONTE CARLO simulator PHITS. (ii) RHBD (Radiation-Hardened By Design) FFs hardened by using specially designed redundant techniques are extensively evaluated. BCDMR (Bistable Cross-Coupled Dual Modular Redundancy) FFs is proposed in order to avoid MCU (Multi-Cell Upset) impacts on FF reliability. Its robustness is demonstrated thorough a set of neutron irradiation tests. (iii) CGRA (Coarse-Grained Reconfigurable Architecture) is proposed for an FPGA-chip-level tolerance. Prototype CGRA-FPGA chips are manufactured and their robustness is demonstrated under alpha particle/neutron irradiation tests. (iv) Simulation techniques for failures in heterogeneous computer system with memory hierarchy consisting of a register file, an L1 cache, an L2 cache and a main memory are also proposed in conjunction with masking effects of faults/errors.

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Authors and Affiliations

  1. Exapalette, LLC., Tokyo, Japan

    Eishi H. Ibe

  2. Kobe University, Kobe, Japan

    Shusuke Yoshimoto, Masahiko Yoshimoto & Hiroshi Kawaguchi

  3. Kyoto Institute of Technology, Kyoto, Japan

    Kazutoshi Kobayashi & Jun Furuta

  4. Kochi University of Technology, Kochi, Japan

    Yukio Mitsuyama

  5. Osaka University, Osaka, Japan

    Masanori Hashimoto & Takao Onoye

  6. Advanced Science, Technology & Management Research Institute of KYOTO (ASTEM), Kyoto, Japan

    Hiroyuki Kanbara

  7. Ritsumeikan University, Kyoto, Japan

    Hiroyuki Ochi

  8. NEC, Tokyo, Japan

    Kazutoshi Wakabayashi

  9. Kyoto University, Kyoto, Japan

    Hidetoshi Onodera

  10. Kyusyu University, Kyusyu, Japan

    Makoto Sugihara

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Ibe, E.H. et al. (2019). Radiation-Induced Soft Errors. In: Asai, S. (eds) VLSI Design and Test for Systems Dependability. Springer, Tokyo. https://doi.org/10.1007/978-4-431-56594-9_3

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