Abstract
A transmission electron microscope (TEM) is based on diffraction phenomena in specimens and image formation by an electromagnetic lens as a convex lens . For thin specimens and single atoms, we can use “phase object approximation (POA) ” and “weak-phase object approximation (WPOA) .”
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
Electron diffraction patterns represent the intensity distribution of wave field far away from a specimen, which is the square of Fourier transform of the exit wave function explained in Sect. 5.1. Inverse Fourier transform of the intensity distribution is named “Patterson function ,” which is not identical to the projected structure of the specimen, because of missing of phase of the wave function. The use of the Patterson function for structure analysis is written in a textbook by Cowley (1981).
- 2.
See a book by Spence and Zuo (1992) for details.
- 3.
The fiber structure of thin films is composed of many microcrystals with alignment of a crystallographic axis. See a book of “Electron diffraction” by Vainstein (1964).
- 4.
In the dynamical theory of electron diffraction of fast electrons, we use the formula of kinematical structure factor inside a unit cell, and interaction of waves between of the unit cells is accurately calculated, which is the modification of the Laue function for the effects between the unit cells based on the kinematical diffraction theory. The theory for low-energy electron diffraction (LEED) less than 100 V in accelerating voltage includes the interaction of waves inside a unit cell, which introduces the complexity of the calculation program (Pendry 1974).
- 5.
A group of the reciprocal points located a plane near the Ewald sphere such as O, H, and G in Fig. 25.1b is named the zeroth-order Laue zone (ZOLZ) . A layer of reciprocal points upper ZOLZ is called the first-order Laue zone (FOLZ) , and those further upper are higher-order Laue zone(HOLZ). Intersection between the reciprocal points in HOLZ and the Ewald sphere produces HOLZ lines, whose analysis gives accurate estimation of lattice strains of a crystal.
- 6.
See Tanaka and Terauchi (1994) for details of analysis of 3D space groups.
References
Cowley, J. M. (1981). Diffraction physics. Amsterdam: North-Holland.
Kittel, C. (1966). Introduction to solid state physics. New York: Wiley.
Pendry, J. B. (1974). Low energy electron diffraction. London: Academic Press.
Spence and Zuo. (1992). Electron micro-diffraction. New York: Plenum Press.
Tanaka, M. & Terauchi, M. (1994). Convergent beam electron diffraction. Tokyo: Maruzen.
Vainstein, B. K. (1964). Structure analysis by electron diffraction. Oxford: Pergamon Press.
Warren, E. B. (1969). X-ray diffraction. New York: Addison Wesley.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2017 Springer Japan KK
About this chapter
Cite this chapter
Tanaka, N. (2017). Electron Diffraction and Convergent Beam Electron Diffraction (CBED). In: Electron Nano-Imaging. Springer, Tokyo. https://doi.org/10.1007/978-4-431-56502-4_25
Download citation
DOI: https://doi.org/10.1007/978-4-431-56502-4_25
Published:
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-56500-0
Online ISBN: 978-4-431-56502-4
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)