Abstract
Fourier transforms play an important role in optics. This concept is also valid for “electron wave” optics , which is the basis of TEM and STEM.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
It is well known that a convex lens produces an inverted image of an object. This corresponds to double operation of a normal Fourier transform. In this book, we note the normal transform from real space (x) to reciprocal space (u) as \( \hat{F} \) and the inverse from (u) to (x) as \( \hat{F}^{ - 1} \).
References
Born, M., & Wolf, E. (1970). Principles of optics (4th ed.). Oxford: Pergamon Press.
Cowley, J. M. (1981). Diffraction physics. Amsterdam: North-Holland.
Goodman, J. W. (1968). Introduction to Fourier optics. San Francisco: McGraw-Hill.
Reimer, L. (1984). Transmission electron microscopy. Berlin: Springer.
Robinson, I. K. (1986). Physical Review B, 33, 3830.
Saxton, W. O., et al. (1983). Ultramicroscopy, 12, 75.
Spence, J. C. H. (2003). High-resolution electron microscopy (3rd ed.). Oxford: Oxford University Press.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2017 Springer Japan KK
About this chapter
Cite this chapter
Tanaka, N. (2017). Introduction to Fourier Transforms for TEM and STEM. In: Electron Nano-Imaging. Springer, Tokyo. https://doi.org/10.1007/978-4-431-56502-4_15
Download citation
DOI: https://doi.org/10.1007/978-4-431-56502-4_15
Published:
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-56500-0
Online ISBN: 978-4-431-56502-4
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)