Abstract
Electromagnetic waves from microwaves to X-ray are widely used in heritage science. The operating frequency region determines the role of the waves, because the responses of materials depend on the frequency. The frequency range of terahertz waves typically refers to the 0.1–10 THz range, which lies the photonics and electronic ranges, and has recently been in the focus of attention in applied optics. Characteristics and examples of THz imaging applications are introduced.
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References
S. Keck, Appl. Opt. 8, 41 (1969)
C. Gaffney, J. Gater, Revealing the Buried Past: Geophysics for Archaeologists (Tempus, Stroud, 2003)
D. Pinna, M. Galeotti, A. Mazzeo, Scientific Examination for the Investigation of Paintings. A Handbook for Conservator-Restorers (Centro Di, Firenze, 2009)
M. Leona, R.V. Duyne, Chemistry and Materials Research at the Interface Between Science and Art. Report of a NSF and A.W. (Mellon Foundation, 2009)
J.R. Wiseman, F. El-Baz, Remote Sensing in Archaeology (Springer, Heidelberg, 2007)
M. Bacci, R. Bellucci, C. Cucci, C. Frosinini, M. Picollo, S. Porcinai, B. Radicati, Fiber optics reflectance spectroscopy in the entire VIS-IR range: A powerful tool for the non-invasive characterization of paintings. MRS Proceedings, 852 (2004)
F. Casadio, L. Toniolo, J. Cult. Herit. 2, 71 (2001)
R.J.H. Clark, Appl. Phys. A. 89, 833 (2007)
A. Anitha, A. Brasoveanu, M. Duarte, S. Hughes, I. Daubechies, J. Dik, K. Janssens, M. Alfeld, Signal Process. 93, 592 (2013)
INSIDDE project. http://insidde-fp7.eu
Charisma Project. http://www.charismaproject.eu
M. Alfeld, J.A. Broekaert, Spectrochim. Acta. B. 88, 211 (2013)
A. Pelagotti, A. Del Mastio, A. De Rosa, A. Pica, IEEE Signal Process. Mag. 25, 27 (2008)
P.H. Siegel, IEEE Trans. Anntenas Propag. 55, 2957 (2007)
K.L. Nguyen, T. Friscic, G.M. Day, L.F. Gladden, W. Jones, Nat. Mater. 6, 206 (2007)
J. Pearce, D.M. Mittleman, Phys. Med. Biol. 47, 3823 (2002)
P.F. Taday, I.V. Bradley, D.D. Arnone, M. Pepper, J. Pharm. Sci. 92, 831 (2003)
P. Taday, Philos. Trans. A. 362, 351 (2004)
C.J. Strachan, P.F. Taday, D.A. Newnham, K.C. Gordon, J.A. Zeitler, M. Pepper, T. Rades, J. Pharm. Sci. 94, 837 (2005)
Y. Ohki, M. Okada, N. Fuse, K. Iwai, M. Mizuno, K. Fukunaga, Appl. Phys. Express 1, 122401 (2008)
M. Scheller, S. Wietzke, C. Jansen, M. Koch, J. Phys. D Appl. Phys. 42, 065415 (2009)
B.B. Hu, M.C. Nuss, Opt. Lett. 20, 1716 (1995)
D.M. Mittleman, R.H. Jacobsen, M.C. Nuss, IEEE Sel. Top. Quants Electron. 2, 679 (1996)
D.M. Mittleman, M. Gupta, R. Neelamani, R.G. Baraniuk, J.V. Rudd, M. Koch, Appl. Phys. B. 68, 1085 (1999)
D.M. Mittleman, Sensing with terahertz radiation (Springer, Berlin, 2003)
D.L. Woolard, E.R. Brown, M. Pepper, M. Kemp, Proc. IEEE 93, 1722 (2005)
W.L. Chan, J. Deibel, D.M. Mittleman, Rep. Prog. Phys. 70, 1325 (2007)
R.A. Cheville, Terahertz time-domain spectroscopy with photoconductive antennas, in Terahertz Spectroscopy. Principles and Applications, ed. by S.L. Dexheimer (CRC Press, Taylor and Francis Group, Boca Raston, 2008), pp. 1–39
M. Tonouchi, IEEE Terahertz Sci. Tech. 2, 90 (2009)
C. Jansen, S. Wietzke, O. Peters, M. Scheller, N. Vieweg, M. Salhi, N. Krumbholz, C. Jördens, T. Hochrein, M. Koch, Appl. Opt. 49, 48 (2010)
J.A. Zeitlerm, Y. Chun Shen, “Industrial applications of teraherts imaging”, chapter 18 of Kai-Erik Peiponen, Makoto Kuwata-Gonokami, in Terahertz Spectroscopy and Imaging, ed. by J. Axel Zeitler (Springer-Verlag, Berlin, 2013), pp. 451–489
N. Fuse, T. Fukuchi, T. Takahashi, M. Mizuno, K. Fukunaga, IEEE Trans. THz Sci. Tech. 2, 242 (2012)
A. Moriguchi, T. Tanaka, T. Sakagami, M. Hangyo, Proc. 13th Intern. Symp. on Nondestructive Characterization of Materials, 44 (2013)
J.B. Jackson, J. Labaune, G.A. Mourou, L. D’Alessandro, A. Whyte, M. Menu, Proc. 36th Intern. Conf. IRMMW-THz and Terahertz Waves, (2011)
S. Wietzke, C. Jördens, N. Krumbholz, B. Baudrit, M. Bastian, M. Koch, J. Eur. Opt. Soc. Rapid Publ. 2, 07013 (2007)
J.-W. Park, K.-H. Im, D.K. Hsu, C.-P. Chiou, D.J. Barnard, Adv. Mater. Res. 123–125, 839 (2010)
C.-C. Chen, D.-J. Lee, T. Pollock, J.F. Whitaker, Opt. Express 18, 3477 (2010)
G. Pastorelli, T. Trafela, P.F. Taday, A. Portieri, D. Lowe, K. Fukunaga, M. Strlič, Analy. Bioanal. Chem. 403, 1405 (2012)
W. Köhler, M. Panzner, U. Klotzbach, E. Beyer, S. S. Winnerl, M. Helm, F. Rutz, C. Jördens, M. Koch, H. Leitner, Proceedings of the 9th ECNDT, 181 (2006)
K. Fukunaga, Y. Ogawa, S. Hayashi, I. Hosako, IEICE Electron. Express 4, 258 (2007)
J.B. Jackson, M. Mourou, J.F. Whitaker, I.N. Duling, S.L. Williamson, M. Menu, G.A. Mourou, Opt. Commun. 281, 527 (2008)
E. Abraham, A. Younus, J.C. Delagnes, P. Mounaix, Appl. Phys. A. 100, 585 (2010)
K. Fukunaga, Non-destructive THz pulsed TDI of Giotto masterpiece. News Conserv. 10, 2 (2009)
K. Fukunaga, M. Picollo, Appl. Phys. A. 100, 591 (2010)
J.B. Jackson, J. Bowen, G. Walker, J. Labaune, G. Mourou, M. Menu, K. Fukunaga, IEEE Trans. Terahertz Sci. Tech. 1, 220 (2011)
K. Fukunaga, M. Picollo, Characterisation of works of art, in K. E. Peiponen et al. eds. Terahertz Spectroscopy and Imaging, Springer Series in Optical Sciences, vol. 171, (Springer, Berlin, 2013), pp. 521–538
E. Abraham, K. Fukunaga, Stud. Conserv. 60, 343 (2015)
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Fukunaga, K. (2016). Introduction. In: THz Technology Applied to Cultural Heritage in Practice. Cultural Heritage Science. Springer, Tokyo. https://doi.org/10.1007/978-4-431-55885-9_1
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DOI: https://doi.org/10.1007/978-4-431-55885-9_1
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