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Deep-Ultraviolet Surface-Enhanced Raman Scattering

  • Chapter
Far- and Deep-Ultraviolet Spectroscopy

Abstract

Surface-enhanced Raman scattering (SERS) is a technique for amplifying a Raman scattering signal, which is intrinsically weak and therefore hard to detect. The Raman enhancement factor can be as high as 102–106 and may even be as high as 1015, which is sufficient to detect Raman scattering from single molecules. By combining this powerful SERS technique with deep-ultraviolet (DUV) resonance Raman spectroscopy, ultrasensitive detection and analysis of molecules by DUV resonance Raman spectroscopy become possible. In this chapter, recent progress in DUV-SERS is reviewed. Also, the available metals for selection as SERS substrates are discussed. As an application of DUV-SERS to molecular nanoimaging, the development of DUV tip-enhanced Raman scattering (TERS) is also described. Finally, some issues to be overcome and future perspectives are discussed.

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Authors and Affiliations

  1. Osaka University, Suita, 565-0871, Osaka, Japan

    Atsushi Taguchi

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  1. Atsushi Taguchi
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Correspondence to Atsushi Taguchi .

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  1. School of Science and Technology, Kwansei Gakuin University, Sanda, Hyogo, Japan

    Yukihiro Ozaki

  2. Graduate School of Engineering, Osaka University, Suita, Osaka, Japan

    Satoshi Kawata

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Taguchi, A. (2015). Deep-Ultraviolet Surface-Enhanced Raman Scattering. In: Ozaki, Y., Kawata, S. (eds) Far- and Deep-Ultraviolet Spectroscopy. Springer, Tokyo. https://doi.org/10.1007/978-4-431-55549-0_8

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