Skip to main content

Ultraviolet Photoelectron Spectroscopy (UPS) III: Direct Study of “Invisible” Band Gap States by Ultrahigh-Sensitivity UPS

  • Chapter
  • First Online:

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 209))

Abstract

We developed ultrahigh sensitivity UPS with very low background, which does not introduce detectable radiation damages into organic materials. The UPS detects density of states of the order of ~1016 states eV−1 cm−3 even for radiation-sensitive organic films, which is comparable to electrical measurements of charge trapping centers. In this chapter we introduce the method of ultrahigh sensitivity measurement and some results on the energy distribution of gap states in pentacene films. Striking effects on the gap states and the energy level alignment due to (i) gas exposure (one atmosphere N2, O2 and Ar) and (ii) hole doping are discussed.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD   109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

References

  1. J. Hwang, E.J. Kim, J. Liu, J.L. Bredas, A. Duggal, A. Kahn, J. Phys. Chem. C 111, 1378 (2007)

    Article  Google Scholar 

  2. G. Heimel, S. Duhm, I. Salzmann, A. Gerlach, A. Strozecka, J. Niederhausen, C. Bürker, T. Hosokai, I. Fernandez-Torrente, G. Schulze, S. Winkler, A. Wilke, R. Schlesinger, J. Frisch, B. Bröker, A. Vollmer, B. Detlefs, J. Pflaum, S. Kera, K.J. Franke, N. Ueno, J.I. Pascual, F. Schreiber, N. Koch, Nat. Chem. 5, 187 (2013)

    Article  Google Scholar 

  3. S. Kera, Y. Yabuuchi, H. Yamane, H. Setoyama, K.K. Okudaira, A. Kahn, N. Ueno, Phys. Rev. B 70, 085304 (2004)

    Article  ADS  Google Scholar 

  4. H.Y. Mao, F. Bussolotti, D.-C. Qi, R. Wang, S. Kera, N. Ueno, A.T.S. Wee, W. Chen, Org. Electron. 12, 534 (2011)

    Article  Google Scholar 

  5. M. Fahlman, A. Crispin, X. Crispin, S.K.M. Henze, M.P. de Jong, W. Osikowicz, C. Tengstedt, W.R. Salaneck, J. Phys. Condens. Matter 19, 183202 (2007)

    Article  ADS  Google Scholar 

  6. H. Fukagawa, S. Kera, T. Kataoka, S. Hosoumi, Y. Watanabe, K. Kudo, N. Ueno, Adv. Mater. 19, 665 (2007)

    Article  Google Scholar 

  7. M. Ono, T. Sueyoshi, Y. Zhang, S. Kera, N. Ueno, Mol. Cryst. Liq. Cryst. 455, 251 (2006)

    Article  Google Scholar 

  8. T. Sueyoshi, H. Fukagawa, M. Ono, S. Kera, N. Ueno, Appl. Phys. Lett. 95, 183303 (2009)

    Article  ADS  Google Scholar 

  9. T. Sueyoshi, H. Kakuta, M. Ono, K. Sakamoto, S. Kera, N. Ueno, Appl. Phys. Lett. 96, 093303 (2010)

    Article  ADS  Google Scholar 

  10. N. Ueno, S. Kera, K. Kanai, in Fundamental Electronic Structure of Organic Solids and Their Interfaces by Photoemission Spectroscopy and Related Methods, ed. by N. Koch, N. Ueno, A.T.S. Wee. The Molecule-Metal Interface, Chap. 7 (Wiley, 2013, Weinheim), pp. 208–212

    Google Scholar 

  11. B. Boudaïffa, P. Cloutier, D. Hunting, M.A. Huels, L. Sanche, Science 287, 1658 (2000)

    Article  ADS  Google Scholar 

  12. See supplemental material of ref. 16, which is at http://link.aps.org/supplemental/10.1103/PhysRevLett.110.267602

  13. H. Fukagawa, H. Yamane, T. Kataoka, S. Kera, M. Nakamura, K. Kudo, N. Ueno, Phys. Rev. B 73, 245310 (2006)

    Article  ADS  Google Scholar 

  14. F. Bussolotti, S. Kera, N. Ueno, Phys. Rev. B 86, 155120 (2012)

    Article  ADS  Google Scholar 

  15. F. De Angelis, S. Cipolloni, L. Mariucci, G. Fortunato, Appl. Phys. Lett. 88, 193508 (2006)

    Article  ADS  Google Scholar 

  16. F. Bussolotti, S. Kera, K. Kudo, A. Kahn, N. Ueno, Phys. Rev. Lett. 110, 267602 (2013)

    Article  ADS  Google Scholar 

  17. S. Duhm, G. Heimel, I. Salzmann, H. Glowatzki, R.L. Johnson, A. Vollmer, J.P. Rabe, N. Koch, Nat. Mater. 7, 326 (2008)

    Article  ADS  Google Scholar 

  18. W.L. Kalb, S. Haas, C. Krellner, T. Mathis, B. Batlogg, Phys. Rev. B 81, 155315 (2010)

    Article  ADS  Google Scholar 

  19. A. Kondo, H. Noguchi, S. Ohnishi, H. Kajiro, A. Tohdo, Y. Hattori, W.-C. Xu, H. Tanaka, H. Kanoh, K. Kaneko, Nano Lett. 6, 2581 (2006)

    Article  ADS  Google Scholar 

  20. H. Kajiro, A. Kondo, K. Kaneko, H. Kanoh, Int. J. Mol. Sci. 11, 3803 (2010)

    Article  Google Scholar 

  21. D.V. Lang, X. Chi, T. Siegrist, A.M. Sergent, A.P. Ramirez, Phys. Rev. Lett. 93, 086802 (2004)

    Article  ADS  Google Scholar 

  22. I. Salzmann, S. Duhm, R. Opitz, J.P. Rabe, N. Koch, Appl. Phys. Lett. 91, 051919 (2007)

    Article  ADS  Google Scholar 

  23. D. Käfer, C. Wöll, G. Witte, Appl. Phys. A 95, 273 (2009)

    Article  ADS  Google Scholar 

  24. D. Käfer, L. Ruppel, G. Witte, Phys. Rev. B 75, 1 (2007)

    Article  Google Scholar 

  25. T. Hosokai et al., Chem. Phys. Lett. 544, 34 (2012)

    Article  ADS  Google Scholar 

  26. J.H. Kang, D. Da Silva Filho, J.-L. Bredas, X.Y. Zhu, Appl. Phys. Lett. 86, 152115 (2005)

    Article  ADS  Google Scholar 

  27. S. Kwon, K.-R. Wee, J.W. Kim, C. Pac, S.O. Kang, J. Chem. Phys. 136, 204706 (2012)

    Article  ADS  Google Scholar 

  28. S. Olthof, S.K. Mohapatra, S. Barlow, S. Mehraeen, V. Coropceanu, J.-L. Brédas, S.R. Marder, A. Kahn, Phys. Rev. Lett. 109, 176601 (2012)

    Article  ADS  Google Scholar 

  29. W. Han, H. Yoshida, N. Ueno, S. Kera, Appl. Phys. Lett. 103, 123303 (2013)

    Article  ADS  Google Scholar 

  30. F. Bussolotti, J-P. Yang, A. Hinderhofer, Y. Huang, W. Chen, S. Kera, A. T. S. Wee, N. Ueno, Phys. Rev. B 89, 115319 (2014)

    Google Scholar 

  31. N. Ueno, S. Kera, K. Kanai, in Fundamental Electronic Structure of Organic Solids and Their Interfaces by Photoemission Spectroscopy and Related Methods, ed. by N. Koch, N. Ueno, A.T.S. Wee. The Molecule-Metal Interface, Chap. 7 (Wiley, 2013, Weinheim), p. 179

    Google Scholar 

  32. Y. Huang, R. Wang, T.C. Niu, S. Kera, N. Ueno, J. Pflaum, A.T.S. Wee, W. Chen, Chem. Commun. 46, 9040 (2010)

    Article  Google Scholar 

  33. H. Fukagawa, S. Hosoumi, H. Yamane, S. Kera, N. Ueno, Phys. Rev. B 83, 085304 (2011)

    Article  ADS  Google Scholar 

Download references

Acknowledgements

The authors are very grateful to Dr. M. Ono of Kaiyo Academy for his contribution to constructing the prototype apparatus. They also deeply thank Prof. K. Kudo and Prof. H. Ishii of Chiba University, Prof. M. Nakamura of Nara Institute of Science and Technology, Prof. A. Kahn of Princeton University, Prof. D. Cahen of Weizmann Institute of Science, Prof. N. Koch of Humboldt University, and Prof. A. T. S. Wee and Prof. W. Chen of National University of Singapore for their discussion on origins of the energy level alignment and gap states.

NU is very grateful to the late Prof. K. Seki of Nagoya University for discussion on the organic interface.

The ultrahigh sensitivity UPS project is supported by 21st Century COE program (MEXT) and Global COE program (MEXT).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Nobuo Ueno .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2015 Springer Japan

About this chapter

Cite this chapter

Ueno, N., Sueyoshi, T., Bussolotti, F., Kera, S. (2015). Ultraviolet Photoelectron Spectroscopy (UPS) III: Direct Study of “Invisible” Band Gap States by Ultrahigh-Sensitivity UPS. In: Ishii, H., Kudo, K., Nakayama, T., Ueno, N. (eds) Electronic Processes in Organic Electronics. Springer Series in Materials Science, vol 209. Springer, Tokyo. https://doi.org/10.1007/978-4-431-55206-2_4

Download citation

Publish with us

Policies and ethics