Abstract
The electronic structure of the bismuth thin film near the \({\overline{\text{M}}}\) point varies depending on the film thickness d due to the quantization along the thickness direction (perpendicular to the surface).
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Y.M. Koroteev, G. Bihlmayer, J.E. Gayone, E.V. Chulkov, S. Blügel, P.M. Echenique, Ph Hofmann, Phys. Rev. Lett. 93, 046403 (2004)
T. Hirahara, K. Miyamoto, A. Kimura, Y. Niinuma, G. Bihlmayer, E.V. Chulkov, T. Nagao, I. Matsuda, S. Qiao, K. Shimada, H. Namatame, M. Taniguchi, S. Hasagawa, New J. Phys. 10, 083038 (2008)
T. Hirahara, T. Nagao, I. Matsuda, G. Bihlmayer, E.V. Chulkov, Y.M. Koroteev, S. Hasegawa, Phys. Rev. B 75, 035422 (2007)
A. Takayama, T. Sato, S. Souma, T. Takahashi, Phys. Rev. Lett. 106, 166401 (2011)
Ph Hofmann, Prog. Surf. Sci. 81, 191 (2006)
T. Hirahara, T. Nagao, I. Matsuda, G. Bihlmayer, E.V. Chulkov, Y.M. Koroteev, P.M. Echenique, M. Saito, S. Hasegawa, Phys. Rev. Lett. 97, 146803 (2006)
T. Hirahara, K. Miyamoto, I. Matsuda, T. Kadono, A. Kimura, T. Nagao, G. Bihlmayer, E.V. Chulkov, S. Qiao, K. Shimada, H. Namatame, M. Taniguchi, S. Hasegawa, Phys. Rev. B 76, 153305 (2007)
A. Kimura, E.E. Krasovskii, R. Nishimura, K. Miyamoto, T. Kadono, K. Kanomaru, E.V. Chulkov, G. Bihlmayer, K. Shimada, H. Namatame, M. Taniguchi, Phys. Rev. Lett. 105, 076804 (2010)
T. Nagao, J.T. Sadowski, M. Saito, S. Yaginuma, Y. Fujikawa, T. Kogure, T. Ohno, Y. Hasegawa, S. Hasegawa, T. Sakurai, Phys. Rev. Lett. 93, 105501 (2004)
T. Nagao, S. Yaginuma, J.T. Sadowski, M. Saito, Y. Fijikawa, T. Ohno, S. Hasegawa, T. Sakurai, J. Surf. Sci. Soc. Jpn. 26, 344 (2005) (in Japanese)
T. Shirasawa, M. Ohyama, W. Voegeli, T. Takahashi, Phys. Rev. B 84, 075411 (2011)
Y. Zhang, K. He, C.Z. Chang, C.L. Song, L.L. Wang, X. Chen, J.F. Jia, Z. Fang, X. Dai, W.Y. Shan, S.Q. Shen, Q. Niu, X.L. Qi, S.C. Zhang, X.C. Ma, Q.K. Xue, Nat. Phys. 6, 584 (2010)
G. Bian, T. Miller, T.C. Chiang, Phys. Rev. Lett. 107, 036802 (2011)
M.P. Seah, W.A. Dench, Surf. Interface Anal. 1, 2 (1979)
C.R. Ast, J. Henk, A. Ernst, L. Moreschini, M.C. Falub, D. Pacilé, P. Bruno, K. Kern, M. Grioni, Phys. Rev. Lett. 98, 186807 (2007)
J. Nitta, T. Akazaki, H. Takayanagi, T. Enoki, Phys. Rev. Lett. 78, 1335 (1997)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2015 Springer Japan
About this chapter
Cite this chapter
Takayama, A. (2015). Rashba Effect at Interface of a Bi Thin Film on Si(111). In: High-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films. Springer Theses. Springer, Tokyo. https://doi.org/10.1007/978-4-431-55028-0_5
Download citation
DOI: https://doi.org/10.1007/978-4-431-55028-0_5
Published:
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-55027-3
Online ISBN: 978-4-431-55028-0
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)