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Rashba Effect at Interface of a Bi Thin Film on Si(111)

  • Akari Takayama
Chapter
Part of the Springer Theses book series (Springer Theses)

Abstract

The electronic structure of the bismuth thin film near the \({\overline{\text{M}}}\) point varies depending on the film thickness d due to the quantization along the thickness direction (perpendicular to the surface).

Keywords

Spin Polarization Topological Insulator Bulk Band Rashba Effect ARPES Measurement 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

  1. 1.
    Y.M. Koroteev, G. Bihlmayer, J.E. Gayone, E.V. Chulkov, S. Blügel, P.M. Echenique, Ph Hofmann, Phys. Rev. Lett. 93, 046403 (2004)CrossRefADSGoogle Scholar
  2. 2.
    T. Hirahara, K. Miyamoto, A. Kimura, Y. Niinuma, G. Bihlmayer, E.V. Chulkov, T. Nagao, I. Matsuda, S. Qiao, K. Shimada, H. Namatame, M. Taniguchi, S. Hasagawa, New J. Phys. 10, 083038 (2008)CrossRefADSGoogle Scholar
  3. 3.
    T. Hirahara, T. Nagao, I. Matsuda, G. Bihlmayer, E.V. Chulkov, Y.M. Koroteev, S. Hasegawa, Phys. Rev. B 75, 035422 (2007)CrossRefADSGoogle Scholar
  4. 4.
    A. Takayama, T. Sato, S. Souma, T. Takahashi, Phys. Rev. Lett. 106, 166401 (2011)CrossRefADSGoogle Scholar
  5. 5.
    Ph Hofmann, Prog. Surf. Sci. 81, 191 (2006)CrossRefADSGoogle Scholar
  6. 6.
    T. Hirahara, T. Nagao, I. Matsuda, G. Bihlmayer, E.V. Chulkov, Y.M. Koroteev, P.M. Echenique, M. Saito, S. Hasegawa, Phys. Rev. Lett. 97, 146803 (2006)CrossRefADSGoogle Scholar
  7. 7.
    T. Hirahara, K. Miyamoto, I. Matsuda, T. Kadono, A. Kimura, T. Nagao, G. Bihlmayer, E.V. Chulkov, S. Qiao, K. Shimada, H. Namatame, M. Taniguchi, S. Hasegawa, Phys. Rev. B 76, 153305 (2007)CrossRefADSGoogle Scholar
  8. 8.
    A. Kimura, E.E. Krasovskii, R. Nishimura, K. Miyamoto, T. Kadono, K. Kanomaru, E.V. Chulkov, G. Bihlmayer, K. Shimada, H. Namatame, M. Taniguchi, Phys. Rev. Lett. 105, 076804 (2010)CrossRefADSGoogle Scholar
  9. 9.
    T. Nagao, J.T. Sadowski, M. Saito, S. Yaginuma, Y. Fujikawa, T. Kogure, T. Ohno, Y. Hasegawa, S. Hasegawa, T. Sakurai, Phys. Rev. Lett. 93, 105501 (2004)CrossRefADSGoogle Scholar
  10. 10.
    T. Nagao, S. Yaginuma, J.T. Sadowski, M. Saito, Y. Fijikawa, T. Ohno, S. Hasegawa, T. Sakurai, J. Surf. Sci. Soc. Jpn. 26, 344 (2005) (in Japanese)CrossRefGoogle Scholar
  11. 11.
    T. Shirasawa, M. Ohyama, W. Voegeli, T. Takahashi, Phys. Rev. B 84, 075411 (2011)CrossRefADSGoogle Scholar
  12. 12.
    Y. Zhang, K. He, C.Z. Chang, C.L. Song, L.L. Wang, X. Chen, J.F. Jia, Z. Fang, X. Dai, W.Y. Shan, S.Q. Shen, Q. Niu, X.L. Qi, S.C. Zhang, X.C. Ma, Q.K. Xue, Nat. Phys. 6, 584 (2010)CrossRefGoogle Scholar
  13. 13.
    G. Bian, T. Miller, T.C. Chiang, Phys. Rev. Lett. 107, 036802 (2011)CrossRefADSGoogle Scholar
  14. 14.
    M.P. Seah, W.A. Dench, Surf. Interface Anal. 1, 2 (1979)CrossRefGoogle Scholar
  15. 15.
    C.R. Ast, J. Henk, A. Ernst, L. Moreschini, M.C. Falub, D. Pacilé, P. Bruno, K. Kern, M. Grioni, Phys. Rev. Lett. 98, 186807 (2007)CrossRefADSGoogle Scholar
  16. 16.
    J. Nitta, T. Akazaki, H. Takayanagi, T. Enoki, Phys. Rev. Lett. 78, 1335 (1997)CrossRefADSGoogle Scholar

Copyright information

© Springer Japan 2015

Authors and Affiliations

  1. 1.Advanced Institute for Materials Research (WPI-AIMR)Tohoku UniversitySendaiJapan

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