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Reliability Graph with General Gates: A Novel Method for Reliability Analysis

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Progress of Nuclear Safety for Symbiosis and Sustainability

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Abstract

There are several methods for system reliability analysis such as reliability graphs, fault tree analyses, Markov chains, and Monte Carlo simulations. Among the existing methods, the reliability graphs are the most intuitive modeling method, but they are not widely used due to their limited expression power. In this paper, an intuitive and practical method for system reliability analysis named the reliability graph with general gates (RGGG) is reviewed. The proposed method introduces general gates to the conventional reliability graph method, which creates a one-to-one match from the actual structure of the system to the reliability graph of the system. A quantitative evaluation method is proposed by transforming the RGGG to an equivalent Bayesian network without losing the intuitiveness of the model. In addition, a method of analyzing the dynamic systems and repairable systems which uses the RGGG is introduced, and appropriate algorithms for the quantitative analyses are explained. It is concluded that the RGGG method is intuitive and easy-to-use in the analyses of static, dynamic, and repairable systems compared with other methods while its analysis results are the same as those of other methods.

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Author information

Authors and Affiliations

  1. Department of Nuclear and Quantum Engineering, Korea Advanced Institute of Science and Technology, 373-1 Guseong-dong, Yuseong-gu, Daejeon, 305-701, Republic of Korea

    Poong Hyun Seong

  2. Research Reactor Engineering Division, Korea Atomic Energy Research Institute, Daedeok-daero 989-111, Yuseong-gu, Daejeon, 305-353, Republic of Korea

    Seung-Ki Shin

Authors
  1. Poong Hyun Seong
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  2. Seung-Ki Shin
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Correspondence to Poong Hyun Seong .

Editor information

Editors and Affiliations

  1. Kyoto University, Kyoto, Japan

    Hidekazu Yoshikawa

  2. College of Nuclear Science and Technolog, Harbin Engineering University, Harbin, China

    Zhijian Zhang

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Seong, P.H., Shin, SK. (2014). Reliability Graph with General Gates: A Novel Method for Reliability Analysis. In: Yoshikawa, H., Zhang, Z. (eds) Progress of Nuclear Safety for Symbiosis and Sustainability. Springer, Tokyo. https://doi.org/10.1007/978-4-431-54610-8_12

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  • DOI: https://doi.org/10.1007/978-4-431-54610-8_12

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  • Publisher Name: Springer, Tokyo

  • Print ISBN: 978-4-431-54609-2

  • Online ISBN: 978-4-431-54610-8

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