Abstract
It could be said that the electron microscope was first invented by Knoll and Ruska (in Germany). Borries and Ruska (Siemens-Halske) developed the 100 kV EM 1932, whose resolution was 10 nm, which would be the first birth of the electron microscope in the world. About 10 years later Hitachi and Toshiba in Japan developed the electron microscope, respectively 1941.
JEOL challenged developing EM, a little bit later. The birth of AD-1 EM, assembled on a wood table, was the debut of our company, JEOL. It was September 1947, a few years after the end of the Pacific War.
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References
Harada Y, Tomita M (2011) Progress of electron-microscope technology in Japan. Microscopy 46(Suppl 3):1–47 (in Japanese)
Knoll M, Ruska E (1932) Z Physik 78:318–339
Von Borries VB, Ruska E (1939) Naturwiss 27:577–582
Martin IC, Whelpton RV, Parnum DH (1937) J Sci Instrum 14:14–24
van Dorsten AC, Nieuwdorp H, Verhoeff A (1950) Philips Tech Rev 12(2):34–51
Fujita H (ed) (1986) History of electron microscopes. Published in commemoration of 11th ICEM, Kyoto, p 212
Komoda T (1986) History of electron microscopes. In: Fujita H (ed) Published in commemoration of 11th ICEM, Kyoto, pp 49–53
Shimadzu S (1986) History of electron microscopes. In: Fujita H (ed) Published in commemoration of 11th ICEM, Kyoto, pp 58–63
Ito K (1986) History of electron microscopes. In: Fujita H (ed) Published in commemoration of 11th ICEM, Kyoto, pp 54–57
Kamogawa H (1986) History of electron microscopes. In: Fujita H (ed) Published in commemoration of 11th ICEM, Kyoto, pp 64–79
Fujita H (ed) (1986) History of electron microscopes. Published in commemoration of 11th ICEM, Kyoto, p 85
JEOL Co. Ltd. (1986) History of JEOL (1); 35 years from its birth, March 1986 (in Japanese)
JEOL Co. Ltd. (2010) History of JEOL (2); creation and development: 60 years from its birth, May 2010 (in Japanese)
Ardenne MV (1942) Electron microscope by Ardenne MV, Springer, Berlin (translated into Japanese from Ardenne MV). Ministry of Education, Maruzen
Product guide (2012) No. 0403C278C Printed in Japan, JEOL Co. Ltd.
Hosokawa F, Tomita T, Naruse M, Honda T, Hartel P, Haider M (2003) J Electron Microsc 52(1):3–10
Tanaka N, Yamazaki J, Saito A (2008) J Vac Soc Jpn 51(11):695–699 (in Japanese)
Isohara Y (2008) J Vac Soc Jpn 51(11):700–706 (in Japanese)
Sawada H, Tomita T, Naruse M, Honda T, Hambridge P, Hartel P, Haider M, Hetherington C, Doole R, Kirkland A, Hutchison J, Tichmarsch J, Cockayne D (2005) J Electron Microsc 54(2):119–121
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Yoshimura, N. (2014). History of JEOL Electron Microscopes. In: Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes. SpringerBriefs in Applied Sciences and Technology. Springer, Tokyo. https://doi.org/10.1007/978-4-431-54448-7_2
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