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Control Charting Normal Variance – Reflections, Curiosities, and Recommendations

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Frontiers in Statistical Quality Control 9

Summary

Following an idea of Box, Hunter & Hunter (1978), the consideration of the log of the sample variance S2 became quite popular in SPC literature concerned with variance monitoring. The sample standard deviation S and the range R are the most common statistics in daily SPC practice. SPC software packages that are used in semiconductor industry offer exclusively R and S control charts. With Castagliola (2005) one new log based transformation started in 2005. Again, the search for symmetry and quasi-normality served as reason to look for a new chart statistic. Symmetry of the chart statistic could help in setting up two-sided control charts. Here, a comparison study is done that looks especially to the two-sided setup, straightens out the view of the available set of competing statistics used for variance monitoring and, eventually, leads to recommendations that could be given in order to choose the right statistic.

†AMTC is a joint venture of Qimonda, AMD and Toppan Photomasks.

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Authors and Affiliations

  1. Engineering, Engineering, Advanced Mask Technology Center†, Dresden, Germany

    Sven Knoth

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  1. Sven Knoth
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Correspondence to Sven Knoth .

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Editors and Affiliations

  1. FB Wirtschaftswissenschaft, FU Berlin, Garystr. 21, Berlin, 14195, Germany

    Hans-Joachim Lenz

  2. FB Wirtschaftswissenschaften, FU Berlin, Garystr. 21, Berlin, 14195, Germany

    Peter-Theodor Wilrich

  3. LS für Quantitative Methoden,, Europa-Universität Viadrina, Grosse Scharrnstr. 59, Frankfurt, 15230, Germany

    Wolfgang Schmid

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Knoth, S. (2010). Control Charting Normal Variance – Reflections, Curiosities, and Recommendations. In: Lenz, HJ., Wilrich, PT., Schmid, W. (eds) Frontiers in Statistical Quality Control 9. Physica-Verlag HD. https://doi.org/10.1007/978-3-7908-2380-6_1

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