Advertisement

A Numerical Technique for the Hierarchical Evaluation of Large, Closed Fault-Tolerant Systems

  • Jacob Abraham
  • Don Lee
  • David Rennels
  • George Gilley
Part of the Dependable Computing and Fault-Tolerant Systems book series (DEPENDABLECOMP, volume 6)

Abstract

This paper describes a novel approach for evaluating the reliability of large fault-tolerant systems. The design hierarchy of the system is preserved during the evaluation, allowing large systems to be analyzed. Semi-Markov models are used at each level in the hierarchy, and a numerical technique is used to combine models from a given level for use at the next level. Different values of parameters, such as coverage, can then be used appropriately at any level, resulting in a much more accurate prediction of reliability. The proposed technique has been validated through comparison with analytical calculations, results from existing tools and Monte-Carlo simulation.

Keywords

Time Slice Design Level Memory Module Large State Space Subsystem Model 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. [1]
    W. Carter and J. Abraham, “Design and evaluation tools for fault-tolerant systems,” in Proceedings of the AIAA Computers in Aerospace VI Conference, pp. 70-77, October 1987.Google Scholar
  2. [2]
    A. M. Johnson and M. Malek, “Survey of software tools for evaluating reliability, availability, and serviceability,” ACM Computing Surveys, vol. 20, pp. 227–269, December 1988.CrossRefGoogle Scholar
  3. [3]
    R. Geist and K. Trivedi, “Reliability estimation of fault-tolerant systems: Tools and techniques,” Computer, pp. 52-61, July 1990.Google Scholar
  4. [4]
    W. G. Bouricius, W. C. Carter, and P. R. Schneider, “Reliability modeling techniques for self-repairing computer systems,” in Proceedings of the 12th ACM National Conference, pp. 295-309, August 1969.Google Scholar
  5. [5]
    J. Dugan, K. Trivedi, M. Smotherman, and R. Geist, “The hybrid automated reliability predictor,” AIAA Journal of Guidance, Control, and Dynamics, pp. 319-331, May–June 1986.Google Scholar
  6. [6]
    K. Trivedi, R. Geist, M. Smotherman, and J. Dugan, “Hybrid modeling of fault-tolerant systems,” Computers and Electrical Engineering, An International Journal, vol. 11, no. 2-3, pp. 87–108, 1985.CrossRefGoogle Scholar
  7. [7]
    R. Sahner and K. Trivedi, “A hierarchial combinatorial-markov method for solving complex reliability models,” in Proceedings ACM/IEEE Fall Joint Computing Conference, November 1986.Google Scholar
  8. [8]
    A. Goyal, W. Carter, E. de Souza e Silva, S. Lavenberg, and K. Trivedi, “The system availability estimator,” in Proceedings of the 16th IEEE Fault-Tolerant Computing Symposium, pp. 84-89, July 1986.Google Scholar
  9. [9]
    S. Bavuso, J. Brunelle, and P. Peterson, “Care iii hands-on demonstration and tutorial,” Technical Memorandum 85811, NASA, May 1984.Google Scholar
  10. [10]
    S. Bavuso, P. Peterson, and D. Rose, “Care iii model overview and user’s guide,” Technical Memorandum 85810, NASA, June 1984.Google Scholar
  11. [11]
    Y. Ng and A. Avizienis, “A unified reliability model for fault-tolerant computers,” IEEE Transactions on Computers, vol. C-29, pp. 1002–1011, November 1980.CrossRefGoogle Scholar
  12. [12]
    S. Makam and A. Avizienis, “Aries 81: A reliability and life-cycle evaluation tool for fault-tolerant systems,” in Proceedings of the IEEE 12th Fault-Tolerant Computing Symposium, pp. 267-274, June 1982.Google Scholar
  13. [13]
    K. Trivedi and R. Geist, “A tutorial on the care iii approach to reliability modeling,” Contractor Report 3488, NASA, December 1981.Google Scholar
  14. [14]
    HARP: The Hybrid Automated Reliability Predictor Introduction and User’ s Guide.Google Scholar

Copyright information

© Springer-Verlag/Wien 1992

Authors and Affiliations

  • Jacob Abraham
    • 1
  • Don Lee
    • 2
  • David Rennels
    • 3
  • George Gilley
    • 2
  1. 1.Computer Engineering Research CenterUniversity of Texas at AustinAustinUSA
  2. 2.Aerospace CorporationLos AngelesUSA
  3. 3.Computer Science DepartmentUniversity of California at Los AngelesLos AngelesUSA

Personalised recommendations