Ellipsometry in Microelectronic Technology
Although the industrial use of ellipsometry is essentially limited to the analysis of insulating non-absorbing films, research applications of this technique within the field of microelectronic technology concentrate on the investigation of semiconducting substrates and layers, and the modifications they undergo during various technological processes. In most cases, spectroscopic methods are applied.
KeywordsVery Large Scale Integrate Doping Density Semiconductor Substrate Lattice Damage Microelectronic Technology
Unable to display preview. Download preview PDF.