Abstract
For surface analysing of solid materials instrumental methods are employed which, using excitation by ion, electron or photon beams, monitor the emission of characteristic ions, electrons and photons from the surface under investigation. The intensity of the measured signal depends on detector efficiency, instrument transmission, sample viewing geometry, angular distribution of the emitted signal and certain sample properties. In most cases the influence of these factors on the measured signal is known only approximately, thus making quantitative analysis possible only by standardisation via standard reference materials (standards for short).
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Gries, W.H. (1985). Ion Implantation in the Surface Analysis of Solid Materials. In: Grasserbauer, M., Wegscheider, W. (eds) Progress in Materials Analysis. Mikrochimica Acta Supplementum, vol 11. Springer, Vienna. https://doi.org/10.1007/978-3-7091-8840-8_3
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DOI: https://doi.org/10.1007/978-3-7091-8840-8_3
Publisher Name: Springer, Vienna
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