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Quantitative Distribution Analysis of Phosphorus in Silicon with Secondary Ion Mass Spectrometry

  • G. Stingeder
  • M. Grasserbauer
  • U. Traxlmayr
  • E. Guerrero
  • H. Pötzl
Part of the Mikrochimica Acta Supplementum book series (MIKROCHIMICA, volume 11)

Abstract

In VLSI-technology (Very Large Scale Integration) tolerances of process parameters are decreasing. Process modelling (in this paper the simulation of dopant profiles) has become an essential development tool. Thermal diffusion is occurring in every temperature step (typical temperature 800–1100 °C). Therefore basic understanding of the physical process influencing the diffusion is very important (e.g. mutual diffusion of different dopant elements, oxidation, nitriding). Since the early 60’s it was already known that at high concentrations (> ~ 1020 cm−3) classical theories (complementary error function, Gaussian distribution) do not correctly describe dopant profiles in silicon. Because of the lack of suitable models they were used up to the early 70’s. After this period more complex models which tried to take into account basic physical concepts were developed. The calculations are mathematically complicated requiring simultaneous partial differential equations.

Keywords

Neutron Activation Analysis Depth Profile Mass Number High Mass Resolution Dopant Profile 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag 1985

Authors and Affiliations

  • G. Stingeder
    • 1
  • M. Grasserbauer
    • 1
  • U. Traxlmayr
    • 2
  • E. Guerrero
    • 2
  • H. Pötzl
    • 2
    • 3
  1. 1.Institute for Analytical ChemistryTechnical University ViennaWienAustria
  2. 2.Institute for General Electrical Engineering and ElectronicsTechnical University ViennaViennaAustria
  3. 3.Ludwig Boltzmann-Institute for Solid State PhysicsViennaAustria

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