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Modern Developments and Applications in Microbeam Analysis pp 371–377Cite as

Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energies

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Part of the book series: Mikrochimica Acta Supplement ((MIKROCHIMICA,volume 15))

Abstract

Dissociation energies, lifetime distributions and internal energies have been determined experimentally for Fen + (4 < n < 10) clusters produced by sputtering under 8.5keVXe+ ion bombardment. The average lifetimes and the average internal energies were calculated from the experimental distributions. A comparison between the results of the present work on Tan + and Nbn + clusters and those obtained earlier has been made. For all sputtered clusters compared, the linear dependence of the average internal energy Ē int on the number of atoms, n, in the cluster has been identified. Good qualitative agreement has been found between experimental results and theoretical values determined from MD-simulations of cluster sputtering processes.

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Authors and Affiliations

  1. Uzbek Academy of Sciences, Arifov Institute of Electronics, 700143, Tashkent, Uzbekistan

    A. D. Bekkerman, N. Kh. Dzhemilev, S. V. Verkhoturov & I. V. Veryovkin

  2. Department of Chemistry, University of Antwerp, B-2610, Antwerpen, Belgium

    A. Adriaens

Authors
  1. A. D. Bekkerman
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  2. N. Kh. Dzhemilev
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  3. S. V. Verkhoturov
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  4. I. V. Veryovkin
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  5. A. Adriaens
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Editor information

Editors and Affiliations

  1. Centre for Electron Optical Studies, University of Bath, UK

    Glyn Love

  2. Department of Physics and Astronomy, University of Glasgow, UK

    W. A. Patrick Nicholson

  3. Istituto LAMEL, C.N.R., Bologna, Italy

    Aldo Armigliato

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© 1998 Springer-Verlag Wien

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Bekkerman, A.D., Dzhemilev, N.K., Verkhoturov, S.V., Veryovkin, I.V., Adriaens, A. (1998). Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energies. In: Love, G., Nicholson, W.A.P., Armigliato, A. (eds) Modern Developments and Applications in Microbeam Analysis. Mikrochimica Acta Supplement, vol 15. Springer, Vienna. https://doi.org/10.1007/978-3-7091-7506-4_49

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  • DOI: https://doi.org/10.1007/978-3-7091-7506-4_49

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-83106-9

  • Online ISBN: 978-3-7091-7506-4

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