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Standardless Analysis

  • Conference paper
Modern Developments and Applications in Microbeam Analysis

Part of the book series: Mikrochimica Acta Supplement ((MIKROCHIMICA,volume 15))

Abstract

Three totally different methods for standardless analysis are reviewed and a new method is presented. Advantages, restrictions and estimated errors of these methods are discussed. For the theoretical prediction of standard net intensities it is shown that the fundamental parameters for K X-rays imply errors at least to the same extent as those for L radiation.

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Author information

Authors and Affiliations

  1. Institute of Applied and Technical Physics, Technical University of Vienna, Wiedner Hauptstrasse 8-10, A-1040, Wien, Austria

    Johann Wernisch & Kurt Röhrbacher

Authors
  1. Johann Wernisch
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  2. Kurt Röhrbacher
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Editor information

Editors and Affiliations

  1. Centre for Electron Optical Studies, University of Bath, UK

    Glyn Love

  2. Department of Physics and Astronomy, University of Glasgow, UK

    W. A. Patrick Nicholson

  3. Istituto LAMEL, C.N.R., Bologna, Italy

    Aldo Armigliato

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© 1998 Springer-Verlag Wien

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Wernisch, J., Röhrbacher, K. (1998). Standardless Analysis. In: Love, G., Nicholson, W.A.P., Armigliato, A. (eds) Modern Developments and Applications in Microbeam Analysis. Mikrochimica Acta Supplement, vol 15. Springer, Vienna. https://doi.org/10.1007/978-3-7091-7506-4_41

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  • DOI: https://doi.org/10.1007/978-3-7091-7506-4_41

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-83106-9

  • Online ISBN: 978-3-7091-7506-4

  • eBook Packages: Springer Book Archive

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