Abstract
Electron probe microanalysis (EPMA) was used to study the composition of nanostructured materials based on insulating porous ‘hosts’ (namely synthetic SiO2 opal) infilled with different ‘guest’ materials. In the bare opal a reduction of the k-ratio compared with that of bulk amorphous silica was observed. In the case of partially or completely infilled opals this discrepancy was found to be less pronounced. The effect was explained in terms of the space charge induced under the incident electron beam. Obviously, this effect is of importance for all microporous materials if the size scale of their voids matches the ionisation length of the electron beam. We have shown that with the right choice of the accelerating voltage and probe size the EPMA-determined composition can be consistent with the data from wet chemical analysis.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
S. G. Romanov, C. M. Sotomayor Torres, in: Nanoparticles in Solids and Solutions: Preparation, Characterisation and Utilization (J. H. Fendler, ed.) VCH, Weinheim, 1997, in press.
T. Ichinokawa, H. Kobayashi, M. Nakjima, Jpn. J. Appl. Phys 1967, 8, 1563.
G. F. Bastin, H. J. M. Heijligers, in: Electron Probe Quantification ( K. F. J. Heinrich, D. E. Newbury, ed.) Plenum, New York, 1991, p. 193.
V. N. Bogomolv, Y. A. Kumzerov, S. G. Romanov, V. V. Zhuravlev, Physica C: Superconductivity 1993, 208, 371.
S. G. Romanov, A. V. Fokin, D. K. Maude, J. C. Portal, Appl. Phys. Lett. 1996, 69, 2897.
S. G. Romanov, N. P. Johnson, H. M. Yates, M. E. Pemble, V. Y. Butko, C. M. Sotomayor Torres, Appl. Phys. Lett. 1997, 70, 2091.
S. V. Pankova, V. V. Poborchii, V. G. Soloviev, J. Phys. Condens. Matter 1996, 8, L203.
J. V. Sanders, Nature 1964, 204 (4964), 1151.
V. G. Balakirev, V. N. Bogomolov, V. V. Zhuravlev, Y. A. Kumzerov, V. P. Petranovsky, S. G. Romanov, L. A. Samoilovich, Crystallogr. Rep. 1993, 38, 348.
R. Mayoral, J. Requena, J. S. Moya, C. Lopez, A. Cintas, Hernan Miguez, F. Meseguer, L. Vazquez, M. Holgado, A. Blanco, Advanced Materials 1997, 9, 257.
J. L. Pouchou F. Pichoir, Rech. Aerosp. 1984, 3, 13.
S. V. Kazakov, S. G. Konnikov, V. V. Tretyakov, Bull Acad. Sci. USSR, Ser. Phys. 1991, 55, 147.
T. S. Rao-Sahib, D. B. Wittry, J. Appl. Phys. 1974, 45, 5060.
J. Cazaux, X-ray Spectrosc. 1996, 25, 256.
S. G. Romanov, A. V. Fokin, V. Y. Butko, V. V. Tretyakov, S. M. Samoilovich C. M. Sotomayor Torres, Fizika Tverdogo Tela 1997, 39, 3347 (in Russian), (English translation Phys. Solid State 1997, 39, 727 ).
V. G. Soloviev, Private Communication.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1998 Springer-Verlag Wien
About this paper
Cite this paper
Tretyakov, V.V., Romanov, S.G., Fokin, A.V., Alperovich, V.I. (1998). EPMA of the Composition of Opal-Based Nanostructured Materials. In: Love, G., Nicholson, W.A.P., Armigliato, A. (eds) Modern Developments and Applications in Microbeam Analysis. Mikrochimica Acta Supplement, vol 15. Springer, Vienna. https://doi.org/10.1007/978-3-7091-7506-4_30
Download citation
DOI: https://doi.org/10.1007/978-3-7091-7506-4_30
Publisher Name: Springer, Vienna
Print ISBN: 978-3-211-83106-9
Online ISBN: 978-3-7091-7506-4
eBook Packages: Springer Book Archive