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Investigation of Electrically Stressed SF6 Gas by Using FT-IR Spectroscopy

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Progress in Fourier Transform Spectroscopy

Part of the book series: Mikrochimica Acta Supplement ((MIKROCHIMICA,volume 14))

Abstract

Compressed gaseous sulphur hexafluoride is commonly used as an insulating medium in high-voltage equipment. In the presence of traces of oxygen and moisture, SF6 can undergo decomposition under electrical stress. FT-IR-spectroscopic methods provide the possibility for a multicomponent trace gas analysis in the SF6-matrix with the option of on-line measurements. Decomposition compounds, produced by partial discharges, can be determined by multivariate spectral data analysis. Time-dependent concentration changes of the SF6 impurities in different infrared gas cells have been evaluated.

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References

  1. H. D. Morrison, J. R. Robins, Proc. SPIE 1994, 2089, 326.

    Article  Google Scholar 

  2. J. K. Wilmshurst, H. J. Bernstein, Can. J. Chem. 1957, 35, 191.

    Article  CAS  Google Scholar 

  3. A. Keens, A. Simon, Proc. SPIE 1994, 2089, 222.

    Article  Google Scholar 

  4. I. Sauer, G. Harman, J. K. Olthoff, R. J. van Brunt, in: Gaseous Dielectrics VI (L. G. Christophorou, I. Sauers, eds.), Plenum, New York, 1991, p. 553.

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© 1997 Springer-Verlag Wien

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Heise, H.M., Janissek, P.R., Kurte, R., Fischer, P., Segundo, S.M.A., Klockow, D. (1997). Investigation of Electrically Stressed SF6 Gas by Using FT-IR Spectroscopy. In: Mink, J., Keresztury, G., Kellner, R. (eds) Progress in Fourier Transform Spectroscopy. Mikrochimica Acta Supplement, vol 14. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6840-0_30

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  • DOI: https://doi.org/10.1007/978-3-7091-6840-0_30

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-211-82931-8

  • Online ISBN: 978-3-7091-6840-0

  • eBook Packages: Springer Book Archive

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