Abstract
Compressed gaseous sulphur hexafluoride is commonly used as an insulating medium in high-voltage equipment. In the presence of traces of oxygen and moisture, SF6 can undergo decomposition under electrical stress. FT-IR-spectroscopic methods provide the possibility for a multicomponent trace gas analysis in the SF6-matrix with the option of on-line measurements. Decomposition compounds, produced by partial discharges, can be determined by multivariate spectral data analysis. Time-dependent concentration changes of the SF6 impurities in different infrared gas cells have been evaluated.
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© 1997 Springer-Verlag Wien
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Heise, H.M., Janissek, P.R., Kurte, R., Fischer, P., Segundo, S.M.A., Klockow, D. (1997). Investigation of Electrically Stressed SF6 Gas by Using FT-IR Spectroscopy. In: Mink, J., Keresztury, G., Kellner, R. (eds) Progress in Fourier Transform Spectroscopy. Mikrochimica Acta Supplement, vol 14. Springer, Vienna. https://doi.org/10.1007/978-3-7091-6840-0_30
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DOI: https://doi.org/10.1007/978-3-7091-6840-0_30
Publisher Name: Springer, Vienna
Print ISBN: 978-3-211-82931-8
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