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Statistical Circuit Modeling

  • Colin C. McAndrew
Conference paper

Abstract

This paper reviews common approaches to statistical circuit modeling, and details their limitations. A simple, efficient, and generic approach to statistical circuit modeling is presented. Backward propagation of variance (BPV) is used to guarantee that the statistical circuit models match variations in key device performances. Examples are provided for MOSFETs and BJTs.

Keywords

Circuit Simulation Junction Depth Geometry Mapping Spice Model TCAD Simulation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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    J. A. Power et al, “Relating statistical MOSFET model parameter variabilities to IC manufacturing process fluctuations enabling realistic worst-case design,” IEEE Trans. Semicond. Manufact., vol. 7, pp. 306–318, 1994.CrossRefGoogle Scholar
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    C. C. McAndrew, “Practical modeling for circuit simulation,” IEEE J. Solid-State Circuits, vol. 33, no. 3, pp. 439–448, Mar. 1998.CrossRefGoogle Scholar

Copyright information

© Springer-Verlag/Wien 1998

Authors and Affiliations

  • Colin C. McAndrew
    • 1
  1. 1.Motorola, Inc.TempeUSA

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