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Nonlocal Oxide Injection Models

  • K. P. Traar
  • A. v. Schwerin

Abstract

Three models for hot carrier injection into the gate oxide layer of a MOSFET are examined and compared with gate current measurement.

Keywords

Gate Voltage Drain Volt Injection Model Interface Point Gate Current 
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References

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Copyright information

© Springer-Verlag Wien 1993

Authors and Affiliations

  • K. P. Traar
    • 1
  • A. v. Schwerin
    • 2
  1. 1.PSE, Siemens AG AustriaWienAustria
  2. 2.Corporate Research and Development, Siemens AGMünchenGermany

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